Thermal x-ray diffraction and near-field phase contrast imaging

Li, Zheng; Classen, Anton; Peng, Tao; Medvedev, Nikita; Wang, Fenglin; Chapman, Henry N.; Shih, Yanhua

doi:10.1209/0295-5075/120/16003

Title: Thermal x-ray diffraction and near-field phase contrast imaging

Abstract

Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. Here in this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs.

Authors:

Li, Zheng ^[1]; Classen, Anton ^[2]; Peng, Tao ^[3]; Medvedev, Nikita ^[4]; Wang, Fenglin ^[5]; Chapman, Henry N. ^[6]; Shih, Yanhua ^[7]

SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science; Max Planck Inst. for the Structure and Dynamics of Matter, Hamburg (Germany)
Univ. Erlangen-Nurnberg, Erlangen (Germany). Inst. fur Optik, Information und Photonik, and Erlangen Graduate School in Advanced Optical Technologies (SAOT)
Texas A & M Univ., College Station, TX (United States). Inst. for Quantum Science and Engineering
Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic). Inst. of Physics and Inst. of Plasma Physics
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science; Univ. of Hamburg (Germany). Dept. of Physics; Hamburg Centre for Ultrafast Imaging, Hamburg (Germany)
Univ. of Maryland, Baltimore, MD (United States). Dept. of Physics

Publication Date:: Wed Dec 27 00:00:00 EST 2017

Research Org.:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Org.:: USDOE; Volkswagen Foundation; Czech Ministry of Education

OSTI Identifier:: 1425347

Grant/Contract Number:: AC02-76SF00515; LG15013; LM2015083

Resource Type:: Accepted Manuscript

Journal Name:: Europhysics Letters

Additional Journal Information:: Journal Volume: 120; Journal Issue: 1; Journal ID: ISSN 0295-5075

Publisher:: IOP Publishing

Country of Publication:: United States

Language:: English

Subject:: 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 47 OTHER INSTRUMENTATION

Citation Formats


                    Li, Zheng, Classen, Anton, Peng, Tao, Medvedev, Nikita, Wang, Fenglin, Chapman, Henry N., and Shih, Yanhua. Thermal x-ray diffraction and near-field phase contrast imaging.  United States: N. p., 2017. 
Web.  doi:10.1209/0295-5075/120/16003.

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                    Li, Zheng, Classen, Anton, Peng, Tao, Medvedev, Nikita, Wang, Fenglin, Chapman, Henry N., & Shih, Yanhua. Thermal x-ray diffraction and near-field phase contrast imaging.  United States.  https://doi.org/10.1209/0295-5075/120/16003

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                    Li, Zheng, Classen, Anton, Peng, Tao, Medvedev, Nikita, Wang, Fenglin, Chapman, Henry N., and Shih, Yanhua. Wed .  
"Thermal x-ray diffraction and near-field phase contrast imaging".  United States.  https://doi.org/10.1209/0295-5075/120/16003.  https://www.osti.gov/servlets/purl/1425347.

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@article{osti_1425347,

  title        = {Thermal x-ray diffraction and near-field phase contrast imaging},

  author       = {Li, Zheng and Classen, Anton and Peng, Tao and Medvedev, Nikita and Wang, Fenglin and Chapman, Henry N. and Shih, Yanhua},

  abstractNote = {Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. Here in this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs.},

  doi          = {10.1209/0295-5075/120/16003},

  journal      = {Europhysics Letters},

  number       = 1,

  volume       = 120,

  place        = {United States},

  year         = {Wed Dec 27 00:00:00 EST 2017},

  month        = {Wed Dec 27 00:00:00 EST 2017}

}

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https://doi.org/10.1209/0295-5075/120/16003

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Figures / Tables:

Figure 1: Schematic description of the proposed setup for xray diffraction using two-photon interference. Photons from a thermal light source reflect from a crystal. The reflected light is divided by a beam splitter (BS) and detected jointly by two pixel detectors D_A and D_B . $z_a$ is the distance betweenmore »

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