A peak position comparison method for high-speed quantitative Laue microdiffraction data processing

Kou, Jiawei; Chen, Kai; Tamura, Nobumichi

doi:10.1016/j.scriptamat.2017.09.005

Title: A peak position comparison method for high-speed quantitative Laue microdiffraction data processing

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Abstract

Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here in this paper, a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy.

Authors:

Kou, Jiawei ^[1];

^[1]; Tamura, Nobumichi ^[2]

Xi'an Jiaotong Univ., Shaanxi (China). Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Lab. for Mechanical Behavior of Materials
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

Publication Date:: Wed Sep 12 00:00:00 EDT 2018

Research Org.:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1419469

Alternate Identifier(s):: OSTI ID: 1549939

Grant/Contract Number:: AC02-05CH11231

Resource Type:: Accepted Manuscript

Journal Name:: Scripta Materialia

Additional Journal Information:: Journal Volume: 143; Journal Issue: C; Journal ID: ISSN 1359-6462

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; Polychromatic X-ray Laue microdiffraction; Orientation mapping; Phase distribution; Plastic deformation

Citation Formats


                    Kou, Jiawei, Chen, Kai, and Tamura, Nobumichi. A peak position comparison method for high-speed quantitative Laue microdiffraction data processing.  United States: N. p., 2018. 
Web.  doi:10.1016/j.scriptamat.2017.09.005.

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                    Kou, Jiawei, Chen, Kai, & Tamura, Nobumichi. A peak position comparison method for high-speed quantitative Laue microdiffraction data processing.  United States.  https://doi.org/10.1016/j.scriptamat.2017.09.005

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                    Kou, Jiawei, Chen, Kai, and Tamura, Nobumichi. Wed .  
"A peak position comparison method for high-speed quantitative Laue microdiffraction data processing".  United States.  https://doi.org/10.1016/j.scriptamat.2017.09.005.  https://www.osti.gov/servlets/purl/1419469.

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@article{osti_1419469,

  title        = {A peak position comparison method for high-speed quantitative Laue microdiffraction data processing},

  author       = {Kou, Jiawei and Chen, Kai and Tamura, Nobumichi},

  abstractNote = {Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here in this paper, a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy.},

  doi          = {10.1016/j.scriptamat.2017.09.005},

  journal      = {Scripta Materialia},

  number       = C,

  volume       = 143,

  place        = {United States},

  year         = {Wed Sep 12 00:00:00 EDT 2018},

  month        = {Wed Sep 12 00:00:00 EDT 2018}

}

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https://doi.org/10.1016/j.scriptamat.2017.09.005

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