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Title: Transient thermal stress wave and vibrational analyses of a thin diamond crystal for X-ray free-electron lasers under high-repetition-rate operation

Abstract

High-brightness X-ray free-electron lasers (FELs) are perceived as fourth-generation light sources providing unprecedented capabilities for frontier scientific researches in many fields. Thin crystals are important to generate coherent seeds in the self-seeding configuration, provide precise spectral measurements, and split X-ray FEL pulses, etc. In all of these applications a high-intensity X-ray FEL pulse impinges on the thin crystal and deposits a certain amount of heat load, potentially impairing the performance. In the present paper, transient thermal stress wave and vibrational analyses as well as transient thermal analysis are carried out to address the thermomechanical issues for thin diamond crystals, especially under high-repetition-rate operation of an X-ray FEL. The material properties at elevated temperatures are considered. It is shown that, for a typical FEL pulse depositing tens of microjoules energy over a spot of tens of micrometers in radius, the stress wave emission is completed on the tens of nanoseconds scale. The amount of kinetic energy converted from a FEL pulse can reach up to ~10 nJ depending on the layer thickness. Natural frequencies of a diamond plate are also computed. The potential vibrational amplitude is estimated as a function of frequency. Here, due to the decreasing heat conductivity with increasingmore » temperature, a runaway temperature rise is predicted for high repetition rates where the temperature rises abruptly after ratcheting up to a point of trivial heat damping rate relative to heat deposition rate.« less

Authors:
 [1];  [1];  [2]
  1. The Univ. of Texas at Arlington, Arlington, TX (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1417649
Grant/Contract Number:  
FWP-2013-SLAC-100164; AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 1; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; diamond; free electron laser; stress waves; thermal shock; thin crystal monochromator; thin crystal spectroscopy; vibration; X-ray

Citation Formats

Yang, Bo, Wang, Songwei, and Wu, Juhao. Transient thermal stress wave and vibrational analyses of a thin diamond crystal for X-ray free-electron lasers under high-repetition-rate operation. United States: N. p., 2018. Web. doi:10.1107/S1600577517015466.
Yang, Bo, Wang, Songwei, & Wu, Juhao. Transient thermal stress wave and vibrational analyses of a thin diamond crystal for X-ray free-electron lasers under high-repetition-rate operation. United States. https://doi.org/10.1107/S1600577517015466
Yang, Bo, Wang, Songwei, and Wu, Juhao. Mon . "Transient thermal stress wave and vibrational analyses of a thin diamond crystal for X-ray free-electron lasers under high-repetition-rate operation". United States. https://doi.org/10.1107/S1600577517015466. https://www.osti.gov/servlets/purl/1417649.
@article{osti_1417649,
title = {Transient thermal stress wave and vibrational analyses of a thin diamond crystal for X-ray free-electron lasers under high-repetition-rate operation},
author = {Yang, Bo and Wang, Songwei and Wu, Juhao},
abstractNote = {High-brightness X-ray free-electron lasers (FELs) are perceived as fourth-generation light sources providing unprecedented capabilities for frontier scientific researches in many fields. Thin crystals are important to generate coherent seeds in the self-seeding configuration, provide precise spectral measurements, and split X-ray FEL pulses, etc. In all of these applications a high-intensity X-ray FEL pulse impinges on the thin crystal and deposits a certain amount of heat load, potentially impairing the performance. In the present paper, transient thermal stress wave and vibrational analyses as well as transient thermal analysis are carried out to address the thermomechanical issues for thin diamond crystals, especially under high-repetition-rate operation of an X-ray FEL. The material properties at elevated temperatures are considered. It is shown that, for a typical FEL pulse depositing tens of microjoules energy over a spot of tens of micrometers in radius, the stress wave emission is completed on the tens of nanoseconds scale. The amount of kinetic energy converted from a FEL pulse can reach up to ~10 nJ depending on the layer thickness. Natural frequencies of a diamond plate are also computed. The potential vibrational amplitude is estimated as a function of frequency. Here, due to the decreasing heat conductivity with increasing temperature, a runaway temperature rise is predicted for high repetition rates where the temperature rises abruptly after ratcheting up to a point of trivial heat damping rate relative to heat deposition rate.},
doi = {10.1107/S1600577517015466},
journal = {Journal of Synchrotron Radiation (Online)},
number = 1,
volume = 25,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2018},
month = {Mon Jan 01 00:00:00 EST 2018}
}

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Cited by: 8 works
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Figures / Tables:

Figure 1: Figure 1:: Schematic showing instantaneous heating and subsequent stress wave emission and heat transfer upon laser energy deposition in a thin crystal layer. The cylindrical coordinate system with axisymmetry is established.

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Works referenced in this record:

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Works referencing / citing this record:

Diffraction properties of a strongly bent diamond crystal used as a dispersive spectrometer for XFEL pulses
journal, June 2019

  • Samoylova, Liubov; Boesenberg, Ulrike; Chumakov, Aleksandr
  • Journal of Synchrotron Radiation, Vol. 26, Issue 4
  • DOI: 10.1107/s1600577519004880

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