Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform
Abstract
The atomic force microscope (AFM) offers unparalleled insight into structure and material functionality across nanometer length scales. However, the spatial resolution afforded by the AFM tip is counterpoised by slow detection speeds compared to other common microscopy techniques (e.g. optical, scanning electron microscopy etc.). In this work, we develop an AFM imaging approach allowing ultrafast reconstruction of the tip-sample forces having ~2 orders of magnitude higher time resolution than standard detection methods. Fast free force recovery (F3R) overcomes the widely-viewed temporal bottleneck in AFM, i.e. the mechanical bandwidth of the cantilever, enabling time-resolved imaging at sub-bandwidth speeds. We demonstrate quantitative recovery of electrostatic forces with ~10 µs temporal resolution, free from cantilever ring-down effects. We further apply the F3R method to Kelvin probe force microscopy (KPFM) measurements. F3R-KPFM is an open loop imaging approach (i.e. no bias feedback), allowing ultrafast surface potential measurements (e.g. < 20 µs) to be performed at regular KPFM scan speeds. F3R-KPFM is demonstrated for exploration of ion migration in organometallic halide perovskites materials and shown to allow spatio-temporal imaging of positively charged ion migration under applied electric field, as well as subsequent formation of accumulated charges at the perovskite/electrode interface. In this work we demonstratemore »
- Authors:
-
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Univ. of Tennessee, Knoxville, TN (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1399933
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- ACS Nano
- Additional Journal Information:
- Journal Volume: 11; Journal Issue: 9; Journal ID: ISSN 1936-0851
- Publisher:
- American Chemical Society (ACS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 77 NANOSCIENCE AND NANOTECHNOLOGY
Citation Formats
Collins, Liam, Ahmadi, Mahshid, Wu, Ting, Hu, Bin, Kalinin, Sergei V., and Jesse, Stephen. Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform. United States: N. p., 2017.
Web. doi:10.1021/acsnano.7b02114.
Collins, Liam, Ahmadi, Mahshid, Wu, Ting, Hu, Bin, Kalinin, Sergei V., & Jesse, Stephen. Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform. United States. https://doi.org/10.1021/acsnano.7b02114
Collins, Liam, Ahmadi, Mahshid, Wu, Ting, Hu, Bin, Kalinin, Sergei V., and Jesse, Stephen. Sun .
"Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform". United States. https://doi.org/10.1021/acsnano.7b02114. https://www.osti.gov/servlets/purl/1399933.
@article{osti_1399933,
title = {Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform},
author = {Collins, Liam and Ahmadi, Mahshid and Wu, Ting and Hu, Bin and Kalinin, Sergei V. and Jesse, Stephen},
abstractNote = {The atomic force microscope (AFM) offers unparalleled insight into structure and material functionality across nanometer length scales. However, the spatial resolution afforded by the AFM tip is counterpoised by slow detection speeds compared to other common microscopy techniques (e.g. optical, scanning electron microscopy etc.). In this work, we develop an AFM imaging approach allowing ultrafast reconstruction of the tip-sample forces having ~2 orders of magnitude higher time resolution than standard detection methods. Fast free force recovery (F3R) overcomes the widely-viewed temporal bottleneck in AFM, i.e. the mechanical bandwidth of the cantilever, enabling time-resolved imaging at sub-bandwidth speeds. We demonstrate quantitative recovery of electrostatic forces with ~10 µs temporal resolution, free from cantilever ring-down effects. We further apply the F3R method to Kelvin probe force microscopy (KPFM) measurements. F3R-KPFM is an open loop imaging approach (i.e. no bias feedback), allowing ultrafast surface potential measurements (e.g. < 20 µs) to be performed at regular KPFM scan speeds. F3R-KPFM is demonstrated for exploration of ion migration in organometallic halide perovskites materials and shown to allow spatio-temporal imaging of positively charged ion migration under applied electric field, as well as subsequent formation of accumulated charges at the perovskite/electrode interface. In this work we demonstrate quantitative F3R-KPFM measurements – however, we fully expect the F3R approach to be valid for all modes of non-contact AFM operation, including non-invasive probing of ultrafast electrical and magnetic dynamics.},
doi = {10.1021/acsnano.7b02114},
journal = {ACS Nano},
number = 9,
volume = 11,
place = {United States},
year = {Sun Aug 06 00:00:00 EDT 2017},
month = {Sun Aug 06 00:00:00 EDT 2017}
}
Web of Science
Works referenced in this record:
Scanning tunneling microscopy
journal, March 1983
- Binnig, G.; Rohrer, H.
- Surface Science, Vol. 126, Issue 1-3
Atomic Force Microscope
journal, March 1986
- Binnig, G.; Quate, C. F.; Gerber, Ch.
- Physical Review Letters, Vol. 56, Issue 9
Atomic resolution with atomic force microscope
journal, October 1987
- Binnig, G.; Gerber, Ch.; Stoll, E.
- Surface Science, Vol. 189-190
Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
journal, May 1987
- Martin, Y.; Williams, C. C.; Wickramasinghe, H. K.
- Journal of Applied Physics, Vol. 61, Issue 10
Magnetic force microscopy of the submicron magnetic assembly in a magnetotactic bacterium
journal, May 1995
- Proksch, R. B.; Schäffer, T. E.; Moskowitz, B. M.
- Applied Physics Letters, Vol. 66, Issue 19
Magnetic Force Microscopy
journal, August 1999
- Hartmann, U.
- Annual Review of Materials Science, Vol. 29, Issue 1
Deposition and imaging of localized charge on insulator surfaces using a force microscope
journal, December 1988
- Stern, J. E.; Terris, B. D.; Mamin, H. J.
- Applied Physics Letters, Vol. 53, Issue 26
High‐resolution capacitance measurement and potentiometry by force microscopy
journal, March 1988
- Martin, Yves; Abraham, David W.; Wickramasinghe, H. Kumar
- Applied Physics Letters, Vol. 52, Issue 13
Kelvin probe force microscopy
journal, June 1991
- Nonnenmacher, M.; O’Boyle, M. P.; Wickramasinghe, H. K.
- Applied Physics Letters, Vol. 58, Issue 25
Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy
journal, December 2007
- Fumagalli, Laura; Ferrari, Giorgio; Sampietro, Marco
- Applied Physics Letters, Vol. 91, Issue 24
Quantitative Nanoscale Dielectric Microscopy of Single-Layer Supported Biomembranes
journal, April 2009
- Fumagalli, Laura; Ferrari, Giorgio; Sampietro, Marco
- Nano Letters, Vol. 9, Issue 4
Label-free identification of single dielectric nanoparticles and viruses with ultraweak polarization forces
journal, July 2012
- Fumagalli, Laura; Esteban-Ferrer, Daniel; Cuervo, Ana
- Nature Materials, Vol. 11, Issue 9
Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy
journal, July 2009
- Riedel, C.; Arinero, R.; Tordjeman, Ph.
- Journal of Applied Physics, Vol. 106, Issue 2
Kelvin Probe Force Microscopy of Periodic Ferroelectric Domain Structure in KTiOPO 4 Crystals
journal, May 2002
- Shvebelman, Maria M.; Agronin, Alex G.; Urenski, Ronen P.
- Nano Letters, Vol. 2, Issue 5
Electrostatic force microscopy: principles and some applications to semiconductors
journal, November 2001
- Girard, Paul
- Nanotechnology, Vol. 12, Issue 4
Kelvin probe force microscopy and its application
journal, January 2011
- Melitz, Wilhelm; Shen, Jian; Kummel, Andrew C.
- Surface Science Reports, Vol. 66, Issue 1
Structural study of Langmuir–Blodgett films by scanning surface potential microscopy
journal, May 1994
- Fujihira, Masamichi
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 12, Issue 3
Effect of SP-C on surface potential distribution in pulmonary surfactant: Atomic force microscopy and Kelvin probe force microscopy study
journal, July 2009
- Hane, Francis; Moores, Brad; Amrein, Matthias
- Ultramicroscopy, Vol. 109, Issue 8
Label-free and high-resolution protein/DNA nanoarray analysis using Kelvin probe force microscopy
journal, September 2007
- Sinensky, Asher K.; Belcher, Angela M.
- Nature Nanotechnology, Vol. 2, Issue 10
Nanoscale electric polarizability of ultrathin biolayers on insulating substrates by electrostatic force microscopy
journal, January 2015
- Dols-Perez, A.; Gramse, G.; Calò, A.
- Nanoscale, Vol. 7, Issue 43
Real-space observation of unbalanced charge distribution inside a perovskite-sensitized solar cell
journal, September 2014
- Bergmann, Victor W.; Weber, Stefan A. L.; Javier Ramos, F.
- Nature Communications, Vol. 5, Issue 1
Surface potential measurement of aged Li-ion batteries using Kelvin probe microscopy
journal, February 2011
- Nagpure, Shrikant C.; Bhushan, Bharat; Babu, S. S.
- Journal of Power Sources, Vol. 196, Issue 3
Internal potential mapping of charged solid-state-lithium ion batteries using in situ Kelvin probe force microscopy
journal, January 2017
- Masuda, Hideki; Ishida, Nobuyuki; Ogata, Yoichiro
- Nanoscale, Vol. 9, Issue 2
In-situ nanoscale mapping of surface potential in all-solid-state thin film Li-ion battery using Kelvin probe force microscopy
journal, March 2012
- Zhu, Jing; Zeng, Kaiyang; Lu, Li
- Journal of Applied Physics, Vol. 111, Issue 6
Li distribution in graphite anodes: A Kelvin Probe Force Microscopy approach
journal, December 2014
- Luchkin, Sergey Yu.; Amanieu, Hugues-Yanis; Rosato, Daniele
- Journal of Power Sources, Vol. 268
Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution
journal, May 2016
- Karatay, Durmus U.; Harrison, Jeffrey S.; Glaz, Micah S.
- Review of Scientific Instruments, Vol. 87, Issue 5
Impact of microstructure on local carrier lifetime in perovskite solar cells
journal, April 2015
- de Quilettes, D. W.; Vorpahl, S. M.; Stranks, S. D.
- Science, Vol. 348, Issue 6235
Charge Recombination in Organic Photovoltaic Devices with High Open-Circuit Voltages
journal, October 2008
- Westenhoff, Sebastian; Howard, Ian A.; Hodgkiss, Justin M.
- Journal of the American Chemical Society, Vol. 130, Issue 41
Facet-dependent photovoltaic efficiency variations in single grains of hybrid halide perovskite
journal, July 2016
- Leblebici, Sibel Y.; Leppert, Linn; Li, Yanbo
- Nature Energy, Vol. 1, Issue 8
Interface engineering of highly efficient perovskite solar cells
journal, July 2014
- Zhou, H.; Chen, Q.; Li, G.
- Science, Vol. 345, Issue 6196
Benefit of Grain Boundaries in Organic–Inorganic Halide Planar Perovskite Solar Cells
journal, February 2015
- Yun, Jae S.; Ho-Baillie, Anita; Huang, Shujuan
- The Journal of Physical Chemistry Letters, Vol. 6, Issue 5
Microscopic Investigation of Grain Boundaries in Organolead Halide Perovskite Solar Cells
journal, December 2015
- Li, Jiang-Jun; Ma, Jing-Yuan; Ge, Qian-Qing
- ACS Applied Materials & Interfaces, Vol. 7, Issue 51
Enhancing Ion Migration in Grain Boundaries of Hybrid Organic-Inorganic Perovskites by Chlorine
journal, May 2017
- Yang, Bin; Brown, Chance C.; Huang, Jingsong
- Advanced Functional Materials, Vol. 27, Issue 26
High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy
journal, July 1999
- Sommerhalter, Ch.; Matthes, Th. W.; Glatzel, Th.
- Applied Physics Letters, Vol. 75, Issue 2
Accuracy and resolution limits of Kelvin probe force microscopy
journal, March 2005
- Zerweck, Ulrich; Loppacher, Christian; Otto, Tobias
- Physical Review B, Vol. 71, Issue 12
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes
journal, April 2013
- Ma, Zong Min; Kou, Lili; Naitoh, Yoshitaka
- Nanotechnology, Vol. 24, Issue 22
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy
journal, March 2011
- Mélin, T.; Barbet, S.; Diesinger, H.
- Review of Scientific Instruments, Vol. 82, Issue 3
Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study
journal, April 2014
- Barbet, S.; Popoff, M.; Diesinger, H.
- Journal of Applied Physics, Vol. 115, Issue 14
The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope
journal, March 2002
- Okamoto, Kenji; Sugawara, Yasuhiro; Morita, Seizo
- Applied Surface Science, Vol. 188, Issue 3-4
Open loop Kelvin probe force microscopy with single and multi-frequency excitation
journal, October 2013
- Collins, L.; Kilpatrick, J. I.; Weber, S. A. L.
- Nanotechnology, Vol. 24, Issue 47
Time-resolved electrostatic force microscopy of polymer solar cells
journal, August 2006
- Coffey, David C.; Ginger, David S.
- Nature Materials, Vol. 5, Issue 9
Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging
journal, October 2010
- Reid, Obadiah G.; Rayermann, Glennis E.; Coffey, David C.
- The Journal of Physical Chemistry C, Vol. 114, Issue 48
Submicrosecond Time Resolution Atomic Force Microscopy for Probing Nanoscale Dynamics
journal, January 2012
- Giridharagopal, Rajiv; Rayermann, Glennis E.; Shao, Guozheng
- Nano Letters, Vol. 12, Issue 2
Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits
journal, October 2015
- Murawski, J.; Graupner, T.; Milde, P.
- Journal of Applied Physics, Vol. 118, Issue 15
Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy
journal, December 2015
- Murawski, J.; Mönch, T.; Milde, P.
- Journal of Applied Physics, Vol. 118, Issue 24
Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy
journal, May 2016
- Garrett, Joseph L.; Munday, Jeremy N.
- Nanotechnology, Vol. 27, Issue 24
Real-Time Nanoscale Open-Circuit Voltage Dynamics of Perovskite Solar Cells
journal, March 2017
- Garrett, Joseph L.; Tennyson, Elizabeth M.; Hu, Miao
- Nano Letters, Vol. 17, Issue 4
Measurement of Surface Photovoltage by Atomic Force Microscopy under Pulsed Illumination
journal, April 2016
- Schumacher, Zeno; Miyahara, Yoichi; Spielhofer, Andreas
- Physical Review Applied, Vol. 5, Issue 4
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
journal, January 2017
- Schumacher, Zeno; Spielhofer, Andreas; Miyahara, Yoichi
- Applied Physics Letters, Vol. 110, Issue 5
Microsecond photocapacitance transients observed using a charged microcantilever as a gated mechanical integrator
journal, June 2017
- Dwyer, Ryan P.; Nathan, Sarah R.; Marohn, John A.
- Science Advances, Vol. 3, Issue 6
Local potential and polarization screening on ferroelectric surfaces
journal, March 2001
- Kalinin, Sergei V.; Bonnell, Dawn A.
- Physical Review B, Vol. 63, Issue 12
Complete information acquisition in dynamic force microscopy
journal, March 2015
- Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen
- Nature Communications, Vol. 6, Issue 1
Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution
journal, May 1987
- Martin, Y.; Wickramasinghe, H. K.
- Applied Physics Letters, Vol. 50, Issue 20
Atomic force microscope with magnetic force modulation
journal, March 1994
- Florin, Ernst‐Ludwig; Radmacher, Manfred; Fleck, Bernhard
- Review of Scientific Instruments, Vol. 65, Issue 3
Photothermal modulation for oscillating mode atomic force microscopy in solution
journal, April 1998
- Ratcliff, Glenn C.; Erie, Dorothy A.; Superfine, Richard
- Applied Physics Letters, Vol. 72, Issue 15
Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments
journal, January 2011
- Labuda, A.; Kobayashi, K.; Kiracofe, D.
- AIP Advances, Vol. 1, Issue 2
Probing Local Bias-Induced Transitions Using Photothermal Excitation Contact Resonance Atomic Force Microscopy and Voltage Spectroscopy
journal, January 2015
- Li, Qian; Jesse, Stephen; Tselev, Alexander
- ACS Nano, Vol. 9, Issue 2
A detailed analysis of the optical beam deflection technique for use in atomic force microscopy
journal, July 1992
- Putman, Constant A. J.; De Grooth, Bart G.; Van Hulst, Niek F.
- Journal of Applied Physics, Vol. 72, Issue 1
Calibration of atomic‐force microscope tips
journal, July 1993
- Hutter, Jeffrey L.; Bechhoefer, John
- Review of Scientific Instruments, Vol. 64, Issue 7
Calibration of rectangular atomic force microscope cantilevers
journal, October 1999
- Sader, John E.; Chon, James W. M.; Mulvaney, Paul
- Review of Scientific Instruments, Vol. 70, Issue 10
Noninvasive determination of optical lever sensitivity in atomic force microscopy
journal, January 2006
- Higgins, M. J.; Proksch, R.; Sader, J. E.
- Review of Scientific Instruments, Vol. 77, Issue 1
Characterization and optimization of scan speed for tapping-mode atomic force microscopy
journal, August 2002
- Sulchek, T.; Yaralioglu, G. G.; Quate, C. F.
- Review of Scientific Instruments, Vol. 73, Issue 8
Calibration of higher eigenmodes of cantilevers
journal, July 2016
- Labuda, Aleksander; Kocun, Marta; Lysy, Martin
- Review of Scientific Instruments, Vol. 87, Issue 7
Quantifying electrostatic force contributions in electrically biased nanoscale interactions
journal, March 2014
- Maragliano, C.; Glia, A.; Stefancich, M.
- Journal of Applied Physics, Vol. 115, Issue 12
Breaking the limits of structural and mechanical imaging of the heterogeneous structure of coal macerals
journal, October 2014
- Collins, L.; Tselev, A.; Jesse, S.
- Nanotechnology, Vol. 25, Issue 43
Full Information Acquisition in Scanning Probe Microscopy
journal, July 2017
- Jesse, S.; Somnath, S.; Collins, L.
- Microscopy Today, Vol. 25, Issue 4
Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy
journal, September 2016
- Somnath, Suhas; Collins, Liam; Matheson, Michael A.
- Nanotechnology, Vol. 27, Issue 41
Model-based extraction of material properties in multifrequency atomic force microscopy
journal, May 2012
- Forchheimer, Daniel; Platz, Daniel; Tholén, Erik A.
- Physical Review B, Vol. 85, Issue 19, Article No. 195449
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy
journal, February 2009
- Jesse, Stephen; Kalinin, Sergei V.
- Nanotechnology, Vol. 20, Issue 8
Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface
journal, April 1998
- Hudlet, S.; Saint Jean, M.; Guthmann, C.
- The European Physical Journal B, Vol. 2, Issue 1
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy
journal, February 2016
- Collins, Liam; Belianinov, Alex; Somnath, Suhas
- Nanotechnology, Vol. 27, Issue 10
G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics
journal, May 2016
- Collins, Liam; Belianinov, Alex; Proksch, Roger
- Applied Physics Letters, Vol. 108, Issue 19
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space
journal, August 2016
- Collins, Liam; Belianinov, Alex; Somnath, Suhas
- Scientific Reports, Vol. 6, Issue 1
The emergence of perovskite solar cells
journal, July 2014
- Green, Martin A.; Ho-Baillie, Anita; Snaith, Henry J.
- Nature Photonics, Vol. 8, Issue 7, p. 506-514
Solar cell efficiency tables (version 50)
journal, June 2017
- Green, Martin A.; Hishikawa, Yoshihiro; Warta, Wilhelm
- Progress in Photovoltaics: Research and Applications, Vol. 25, Issue 7
Efficient and stable solution-processed planar perovskite solar cells via contact passivation
journal, February 2017
- Tan, Hairen; Jain, Ankit; Voznyy, Oleksandr
- Science, Vol. 355, Issue 6326
Metal-halide perovskites for photovoltaic and light-emitting devices
journal, May 2015
- Stranks, Samuel D.; Snaith, Henry J.
- Nature Nanotechnology, Vol. 10, Issue 5
Resolving Weak Light of Sub-picowatt per Square Centimeter by Hybrid Perovskite Photodetectors Enabled by Noise Reduction
journal, March 2015
- Fang, Yanjun; Huang, Jinsong
- Advanced Materials, Vol. 27, Issue 17
Detection of gamma photons using solution-grown single crystals of hybrid lead halide perovskites
journal, July 2016
- Yakunin, Sergii; Dirin, Dmitry N.; Shynkarenko, Yevhen
- Nature Photonics, Vol. 10, Issue 9
Sensitive X-ray detectors made of methylammonium lead tribromide perovskite single crystals
journal, March 2016
- Wei, Haotong; Fang, Yanjun; Mulligan, Padhraic
- Nature Photonics, Vol. 10, Issue 5
Perovskites: The Emergence of a New Era for Low-Cost, High-Efficiency Solar Cells
journal, October 2013
- Snaith, Henry J.
- The Journal of Physical Chemistry Letters, Vol. 4, Issue 21, p. 3623-3630
Ion Migration in Organometal Trihalide Perovskite and Its Impact on Photovoltaic Efficiency and Stability
journal, January 2016
- Yuan, Yongbo; Huang, Jinsong
- Accounts of Chemical Research, Vol. 49, Issue 2
Hysteresis, Stability, and Ion Migration in Lead Halide Perovskite Photovoltaics
journal, May 2016
- Miyano, Kenjiro; Yanagida, Masatoshi; Tripathi, Neeti
- The Journal of Physical Chemistry Letters, Vol. 7, Issue 12
Can slow-moving ions explain hysteresis in the current–voltage curves of perovskite solar cells?
journal, January 2016
- Richardson, Giles; O'Kane, Simon E. J.; Niemann, Ralf G.
- Energy & Environmental Science, Vol. 9, Issue 4
Anomalous Hysteresis in Perovskite Solar Cells
journal, April 2014
- Snaith, Henry J.; Abate, Antonio; Ball, James M.
- The Journal of Physical Chemistry Letters, Vol. 5, Issue 9
Giant switchable photovoltaic effect in organometal trihalide perovskite devices
journal, December 2014
- Xiao, Zhengguo; Yuan, Yongbo; Shao, Yuchuan
- Nature Materials, Vol. 14, Issue 2
Electric-Field-Driven Reversible Conversion Between Methylammonium Lead Triiodide Perovskites and Lead Iodide at Elevated Temperatures
journal, December 2015
- Yuan, Yongbo; Wang, Qi; Shao, Yuchuan
- Advanced Energy Materials, Vol. 6, Issue 2
Anomalous photovoltaic effect in organic-inorganic hybrid perovskite solar cells
journal, March 2017
- Yuan, Yongbo; Li, Tao; Wang, Qi
- Science Advances, Vol. 3, Issue 3
Local Time-Dependent Charging in a Perovskite Solar Cell
journal, July 2016
- Bergmann, Victor W.; Guo, Yunlong; Tanaka, Hideyuki
- ACS Applied Materials & Interfaces, Vol. 8, Issue 30
Defect migration in methylammonium lead iodide and its role in perovskite solar cell operation
journal, January 2015
- Azpiroz, Jon M.; Mosconi, Edoardo; Bisquert, Juan
- Energy & Environmental Science, Vol. 8, Issue 7
High-quality bulk hybrid perovskite single crystals within minutes by inverse temperature crystallization
journal, July 2015
- Saidaminov, Makhsud I.; Abdelhady, Ahmed L.; Murali, Banavoth
- Nature Communications, Vol. 6, Article No. 7586
Works referencing / citing this record:
Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements
journal, January 2019
- Mascaro, Aaron; Miyahara, Yoichi; Enright, Tyler
- Beilstein Journal of Nanotechnology, Vol. 10
Time resolved surface photovoltage measurements using a big data capture approach to KPFM
journal, September 2018
- Collins, Liam; Ahmadi, Mahshid; Qin, Jiajun
- Nanotechnology, Vol. 29, Issue 44
Imaging photogenerated charge carriers on surfaces and interfaces of photocatalysts with surface photovoltage microscopy
journal, January 2018
- Chen, Ruotian; Fan, Fengtao; Dittrich, Thomas
- Chemical Society Reviews, Vol. 47, Issue 22
How the formation of interfacial charge causes hysteresis in perovskite solar cells
journal, January 2018
- Weber, Stefan A. L.; Hermes, Ilka M.; Turren-Cruz, Silver-Hamill
- Energy & Environmental Science, Vol. 11, Issue 9
Imaging Metal Halide Perovskites Material and Properties at the Nanoscale
journal, December 2019
- Howard, John M.; Lahoti, Richa; Leite, Marina S.
- Advanced Energy Materials
Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique
journal, January 2017
- Calahorra, Yonatan; Smith, Michael; Datta, Anuja
- Nanoscale, Vol. 9, Issue 48
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review
journal, July 2018
- Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V.
- Reports on Progress in Physics, Vol. 81, Issue 8
High-throughput sequential excitation for nanoscale mapping of electrochemical strain in granular ceria
journal, January 2019
- Huang, Boyuan; Esfahani, Ehsan Nasr; Yu, Junxi
- Nanoscale, Vol. 11, Issue 48
Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques
journal, December 2018
- Kilpatrick, Jason I.; Collins, Liam; Weber, Stefan A. L.
- Review of Scientific Instruments, Vol. 89, Issue 12
Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale
journal, January 2019
- Borgani, Riccardo; Haviland, David B.
- Review of Scientific Instruments, Vol. 90, Issue 1
Heterogeneity at multiple length scales in halide perovskite semiconductors
journal, July 2019
- Tennyson, Elizabeth M.; Doherty, Tiarnan A. S.; Stranks, Samuel D.
- Nature Reviews Materials, Vol. 4, Issue 9
Application of pan-sharpening algorithm for correlative multimodal imaging using AFM-IR
journal, April 2019
- Borodinov, Nikolay; Bilkey, Natasha; Foston, Marcus
- npj Computational Materials, Vol. 5, Issue 1
Progress of Surface Science Studies on ABX 3 ‐Based Metal Halide Perovskite Solar Cells
journal, April 2020
- Qiu, Longbin; He, Sisi; Ono, Luis K.
- Advanced Energy Materials, Vol. 10, Issue 13
Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique
text, January 2017
- Calahorra, Yonatan; Smith, Mike; Datta, Anuja
- Apollo - University of Cambridge Repository
Heterogeneity at multiple length scales in halide perovskite semiconductors
text, January 2019
- Tennyson, Beth; Doherty, Tas; Stranks, Samuel
- Apollo - University of Cambridge Repository
Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale
text, January 2018
- Borgani, Riccardo; Haviland, David B.
- arXiv
High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping
journal, June 2018
- Li, Xin; Collins, Liam; Miyazawa, Keisuke
- Nature Communications, Vol. 9, Issue 1
Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements
journal, January 2019
- Mascaro, Aaron; Miyahara, Yoichi; Enright, Tyler
- Beilstein Journal of Nanotechnology, Vol. 10