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Title: Interlayer bond polarizability model for stacking-dependent low-frequency Raman scattering in layered materials

Abstract

A simple model is developed to reveal the stacking dependence of Raman intensities of interlayer vibrations in 2D materials.

Authors:
ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [2]; ORCiD logo [3]
  1. Rensselaer Polytechnic Inst., Troy, NY (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  3. Rensselaer Polytechnic Inst., Troy, NY (United States)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1399929
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Nanoscale
Additional Journal Information:
Journal Volume: 9; Journal ID: ISSN 2040-3364
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Liang, Liangbo, Puretzky, Alexander A., Sumpter, Bobby G., and Meunier, Vincent. Interlayer bond polarizability model for stacking-dependent low-frequency Raman scattering in layered materials. United States: N. p., 2017. Web. doi:10.1039/c7nr05839j.
Liang, Liangbo, Puretzky, Alexander A., Sumpter, Bobby G., & Meunier, Vincent. Interlayer bond polarizability model for stacking-dependent low-frequency Raman scattering in layered materials. United States. https://doi.org/10.1039/c7nr05839j
Liang, Liangbo, Puretzky, Alexander A., Sumpter, Bobby G., and Meunier, Vincent. Fri . "Interlayer bond polarizability model for stacking-dependent low-frequency Raman scattering in layered materials". United States. https://doi.org/10.1039/c7nr05839j. https://www.osti.gov/servlets/purl/1399929.
@article{osti_1399929,
title = {Interlayer bond polarizability model for stacking-dependent low-frequency Raman scattering in layered materials},
author = {Liang, Liangbo and Puretzky, Alexander A. and Sumpter, Bobby G. and Meunier, Vincent},
abstractNote = {A simple model is developed to reveal the stacking dependence of Raman intensities of interlayer vibrations in 2D materials.},
doi = {10.1039/c7nr05839j},
journal = {Nanoscale},
number = ,
volume = 9,
place = {United States},
year = {Fri Sep 22 00:00:00 EDT 2017},
month = {Fri Sep 22 00:00:00 EDT 2017}
}

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Cited by: 31 works
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