DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials

Abstract

A suite of non-destructive, three-dimensional X-ray microscopy techniques have recently been developed and used to characterize the microstructures of polycrystalline materials. These techniques utilize high-energy synchrotron radiation and include near-field and far-field diffraction microscopy (NF- and FF-HEDM, respectively) and absorption tomography. Several compatible sample environments have also been developed, enabling a wide range of 3D studies of material evolution. In this article, the FF-HEDM technique is described in detail, including its implementation at the 1-ID beamline of the Advanced Photon Source. Examples of how the information obtained from FF-HEDM can be used to deepen our understanding of structure-property-processing relationships in selected materials are presented.

Authors:
 [1];  [2];  [1];  [3];  [2];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Nuclear Engineering Division
  3. Max Planck Inst. for Iron Research, Dusseldorf (Germany)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Nuclear Energy (NE)
OSTI Identifier:
1390810
Grant/Contract Number:  
AC02-06CH11357; FG02-10ER46758
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy Today
Additional Journal Information:
Journal Volume: 25; Journal Issue: 05; Journal ID: ISSN 1551-9295
Publisher:
Cambridge University Press
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, and Almer, Jonathan. Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. United States: N. p., 2017. Web. doi:10.1017/S1551929517000827.
Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, & Almer, Jonathan. Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials. United States. https://doi.org/10.1017/S1551929517000827
Park, Jun-Sang, Zhang, Xuan, Kenesei, Peter, Wong, Su Leen, Li, Meimei, and Almer, Jonathan. Thu . "Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials". United States. https://doi.org/10.1017/S1551929517000827. https://www.osti.gov/servlets/purl/1390810.
@article{osti_1390810,
title = {Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials},
author = {Park, Jun-Sang and Zhang, Xuan and Kenesei, Peter and Wong, Su Leen and Li, Meimei and Almer, Jonathan},
abstractNote = {A suite of non-destructive, three-dimensional X-ray microscopy techniques have recently been developed and used to characterize the microstructures of polycrystalline materials. These techniques utilize high-energy synchrotron radiation and include near-field and far-field diffraction microscopy (NF- and FF-HEDM, respectively) and absorption tomography. Several compatible sample environments have also been developed, enabling a wide range of 3D studies of material evolution. In this article, the FF-HEDM technique is described in detail, including its implementation at the 1-ID beamline of the Advanced Photon Source. Examples of how the information obtained from FF-HEDM can be used to deepen our understanding of structure-property-processing relationships in selected materials are presented.},
doi = {10.1017/S1551929517000827},
journal = {Microscopy Today},
number = 05,
volume = 25,
place = {United States},
year = {Thu Aug 31 00:00:00 EDT 2017},
month = {Thu Aug 31 00:00:00 EDT 2017}
}

Works referenced in this record:

Characterization of neutron-irradiated HT-UPS steel by high-energy X-ray diffraction microscopy
journal, April 2016


A rotational and axial motion system load frame insert for in situ high energy x-ray studies
journal, September 2015

  • Shade, Paul A.; Blank, Basil; Schuren, Jay C.
  • Review of Scientific Instruments, Vol. 86, Issue 9
  • DOI: 10.1063/1.4927855

i RadMat: A thermo-mechanical testing system for in situ high-energy X-ray characterization of radioactive specimens
journal, January 2017

  • Zhang, Xuan; Xu, Chi; Wang, Leyun
  • Review of Scientific Instruments, Vol. 88, Issue 1
  • DOI: 10.1063/1.4974246

Determining heterogeneous slip activity on multiple slip systems from single crystal orientation pole figures
journal, September 2016


High-energy diffraction microscopy at the advanced photon source
journal, July 2011


Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis
journal, March 2009

  • Ludwig, W.; Reischig, P.; King, A.
  • Review of Scientific Instruments, Vol. 80, Issue 3
  • DOI: 10.1063/1.3100200

Combining flat crystals, bent crystals and compound refractive lenses for high-energy X-ray optics
journal, February 2004


The MAX IV storage ring project
journal, August 2014

  • Tavares, Pedro F.; Leemann, Simon C.; Sjöström, Magnus
  • Journal of Synchrotron Radiation, Vol. 21, Issue 5
  • DOI: 10.1107/S1600577514011503

High-energy X-ray optics with silicon saw-tooth refractive lenses
journal, February 2007


Quantitative grain-scale ferroic domain volume fractions and domain switching strains from three-dimensional X-ray diffraction data
journal, May 2015

  • Oddershede, Jette; Majkut, Marta; Cao, Qinghua
  • Journal of Applied Crystallography, Vol. 48, Issue 3
  • DOI: 10.1107/S1600576715007669

Non-Destructive Characterization of Engineering Materials Using High-Energy X-rays at the Advanced Photon Source
journal, May 2017


Far-field high-energy diffraction microscopy: a tool for intergranular orientation and strain analysis
journal, July 2011

  • Bernier, J. V.; Barton, N. R.; Lienert, U.
  • The Journal of Strain Analysis for Engineering Design, Vol. 46, Issue 7
  • DOI: 10.1177/0309324711405761

Thermal and Electric Field-Dependent Evolution of Domain Structures in Polycrystalline BaTiO 3 Using the 3D-XRD Technique
journal, January 2010

  • Varlioglu, Mesut; Lienert, Ulrich; Park, Jun-Sang
  • Texture, Stress, and Microstructure, Vol. 2010
  • DOI: 10.1155/2010/910793

In situ single-grain peak profile measurements on Ti–7Al during tensile deformation
journal, October 2009

  • Lienert, U.; Brandes, M. C.; Bernier, J. V.
  • Materials Science and Engineering: A, Vol. 524, Issue 1-2
  • DOI: 10.1016/j.msea.2009.06.047

Big Data Staging with MPI-IO for Interactive X-ray Science
conference, December 2014

  • Wozniak, Justin M.; Sharma, Hemant; Armstrong, Timothy G.
  • 2014 IEEE/ACM International Symposium on Big Data Computing (BDC)
  • DOI: 10.1109/BDC.2014.18

Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source
journal, November 2007

  • Lee, J. H.; Almer, J.; Aydιner, C.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 582, Issue 1
  • DOI: 10.1016/j.nima.2007.08.103

In situ assessment of lattice strain in an Al–Li alloy
journal, May 2013


From Historical Backgrounds to Recent Advances in 3D Characterization of Materials: An Overview
journal, December 2016


Quantitative X-ray tomography
journal, December 2013


High-energy synchrotron x-ray techniques for studying irradiated materials
journal, March 2015

  • Park, Jun-Sang; Zhang, Xuan; Sharma, Hemant
  • Journal of Materials Research, Vol. 30, Issue 9
  • DOI: 10.1557/jmr.2015.50

In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals
journal, December 2004


A framework for generating synthetic diffraction images from deforming polycrystals using crystal-based finite element formulations
journal, September 2013


Silicon saw-tooth refractive lens for high-energy X-rays made using a diamond saw
journal, March 2010


An introduction to three-dimensional X-ray diffraction microscopy
journal, October 2012


Probing Microstructure Dynamics With X-Ray Diffraction Microscopy
journal, March 2008

  • Suter, R. M.; Hefferan, C. M.; Li, S. F.
  • Journal of Engineering Materials and Technology, Vol. 130, Issue 2
  • DOI: 10.1115/1.2840965

Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies
journal, September 2008