Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes
- Authors:
-
[1];
[3];
[2];
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Univ. of Illinois, Chicago, IL (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Univ. of Illinois, Chicago, IL (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States); Energy Frontier Research Centers (EFRC) (United States). Northeastern Center for Chemical Energy Storage (NECCES); Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1374594
- Alternate Identifier(s):
- OSTI ID: 1389236
- Report Number(s):
- BNL-114212-2017-JA
Journal ID: ISSN 1530-6984; 132046
- Grant/Contract Number:
- AC02-06CH11357; SC0001294; SC0012704
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Nano Letters
- Additional Journal Information:
- Journal Volume: 17; Journal Issue: 6; Journal ID: ISSN 1530-6984
- Publisher:
- American Chemical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 25 ENERGY STORAGE; batteries; Capacity fading; intergranular cracking; operando X-ray diffraction; 77 NANOSCIENCE AND NANOTECHNOLOGY; inter-granular cracking; Center for Functional Nanomaterials
Citation Formats
Liu, Hao, Wolf, Mark, Karki, Khim, Yu, Young -Sang, Stach, Eric A., Cabana, Jordi, Chapman, Karena W., and Chupas, Peter J. Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes. United States: N. p., 2017.
Web. doi:10.1021/acs.nanolett.7b00379.
Liu, Hao, Wolf, Mark, Karki, Khim, Yu, Young -Sang, Stach, Eric A., Cabana, Jordi, Chapman, Karena W., & Chupas, Peter J. Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes. United States. https://doi.org/10.1021/acs.nanolett.7b00379
Liu, Hao, Wolf, Mark, Karki, Khim, Yu, Young -Sang, Stach, Eric A., Cabana, Jordi, Chapman, Karena W., and Chupas, Peter J. Fri .
"Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes". United States. https://doi.org/10.1021/acs.nanolett.7b00379. https://www.osti.gov/servlets/purl/1374594.
@article{osti_1374594,
title = {Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes},
author = {Liu, Hao and Wolf, Mark and Karki, Khim and Yu, Young -Sang and Stach, Eric A. and Cabana, Jordi and Chapman, Karena W. and Chupas, Peter J.},
abstractNote = {},
doi = {10.1021/acs.nanolett.7b00379},
journal = {Nano Letters},
number = 6,
volume = 17,
place = {United States},
year = {Fri May 26 00:00:00 EDT 2017},
month = {Fri May 26 00:00:00 EDT 2017}
}
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