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Title: Ptychographic x-ray imaging of surfaces on crystal truncation rod

Abstract

Ptychography is a high-resolution imaging technique which does not require lenses for image magnification and which provides phase contrast with high sensitivity. Here we propose to use x-ray ptychography for the imaging of surface structure in crystalline samples. We show that ptychography can be used to image atomic structures using coherent diffraction patterns recorded along the crystal truncation rod of a crystal surface. In a proof-of-concept experiment on a Pt(111) sample, we present ptychographic reconstructions showing features consistent with surface steps. Furthermore, due to the penetration power of x-rays, this method could find interesting applications for the study of surface structures under buried interfaces or in harsh environments.

Authors:
 [1];  [2];  [3];  [4];  [2];  [2];  [5]; ORCiD logo [2];  [6];  [3]; ORCiD logo [2]
  1. Argonne National Lab. (ANL), Argonne, IL (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
  4. Safarik Univ., Kosice (Slovakia)
  5. Brookhaven National Lab. (BNL), Upton, NY (United States)
  6. Rochester Inst. of Technology, Rochester, NY (United States)
Publication Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
OSTI Identifier:
1356998
Grant/Contract Number:  
AC02-06CH11357; ITMS 26220120005
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 106; Journal Issue: 10; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Surface optics; Lenses; X-ray imaging; Ptychography; Electronic noise; X-ray scattering; Crystallography; Diffractometers; Optical metrology; Atomic force microscopy

Citation Formats

Zhu, Chenhui, Harder, Ross, Diaz, Ana, Komanicky, Vladimir, Barbour, Andi, Xu, Ruqing, Huang, Xiaojing, Liu, Yaohua, Pierce, Michael S., Menzel, Andreas, and You, Hoydoo. Ptychographic x-ray imaging of surfaces on crystal truncation rod. United States: N. p., 2015. Web. doi:10.1063/1.4914927.
Zhu, Chenhui, Harder, Ross, Diaz, Ana, Komanicky, Vladimir, Barbour, Andi, Xu, Ruqing, Huang, Xiaojing, Liu, Yaohua, Pierce, Michael S., Menzel, Andreas, & You, Hoydoo. Ptychographic x-ray imaging of surfaces on crystal truncation rod. United States. https://doi.org/10.1063/1.4914927
Zhu, Chenhui, Harder, Ross, Diaz, Ana, Komanicky, Vladimir, Barbour, Andi, Xu, Ruqing, Huang, Xiaojing, Liu, Yaohua, Pierce, Michael S., Menzel, Andreas, and You, Hoydoo. Mon . "Ptychographic x-ray imaging of surfaces on crystal truncation rod". United States. https://doi.org/10.1063/1.4914927. https://www.osti.gov/servlets/purl/1356998.
@article{osti_1356998,
title = {Ptychographic x-ray imaging of surfaces on crystal truncation rod},
author = {Zhu, Chenhui and Harder, Ross and Diaz, Ana and Komanicky, Vladimir and Barbour, Andi and Xu, Ruqing and Huang, Xiaojing and Liu, Yaohua and Pierce, Michael S. and Menzel, Andreas and You, Hoydoo},
abstractNote = {Ptychography is a high-resolution imaging technique which does not require lenses for image magnification and which provides phase contrast with high sensitivity. Here we propose to use x-ray ptychography for the imaging of surface structure in crystalline samples. We show that ptychography can be used to image atomic structures using coherent diffraction patterns recorded along the crystal truncation rod of a crystal surface. In a proof-of-concept experiment on a Pt(111) sample, we present ptychographic reconstructions showing features consistent with surface steps. Furthermore, due to the penetration power of x-rays, this method could find interesting applications for the study of surface structures under buried interfaces or in harsh environments.},
doi = {10.1063/1.4914927},
journal = {Applied Physics Letters},
number = 10,
volume = 106,
place = {United States},
year = {Mon Mar 09 00:00:00 EDT 2015},
month = {Mon Mar 09 00:00:00 EDT 2015}
}

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Cited by: 9 works
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