Optical and electrical properties of indium tin oxide films near their laser damage threshold [Electrical and optical properties of indium tin oxide films under multi-pulse laser irradiation at 1064 nm]
Abstract
In this paper, we investigated whether the optical and electrical properties of indium tin oxide (ITO) films are degraded under laser irradiation below their laser ablation threshold. While performing multi-pulse laser damage experiments on a single ITO film (4.7 ns, 1064 nm, 10 Hz), we examined the optical and electrical properties in situ. A decrease in reflectance was observed prior to laser damage initiation. However, under sub-damage threshold irradiation, conductivity and reflectance of the film were maintained without measurable degradation. This indicates that ITO films in optoelectronic devices may be operated below their lifetime laser damage threshold without noticeable performance degradation.
- Authors:
-
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1345329
- Report Number(s):
- LLNL-JRNL-712977
Journal ID: ISSN 2159-3930
- Grant/Contract Number:
- AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Optical Materials Express
- Additional Journal Information:
- Journal Volume: 7; Journal Issue: 3; Journal ID: ISSN 2159-3930
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 42 ENGINEERING; lasers and laser optics; laser materials; laser damage; optics at surfaces
Citation Formats
Yoo, Jae -Hyuck, Lange, Andrew, Bude, Jeff, and Elhadj, Selim. Optical and electrical properties of indium tin oxide films near their laser damage threshold [Electrical and optical properties of indium tin oxide films under multi-pulse laser irradiation at 1064 nm]. United States: N. p., 2017.
Web. doi:10.1364/OME.7.000817.
Yoo, Jae -Hyuck, Lange, Andrew, Bude, Jeff, & Elhadj, Selim. Optical and electrical properties of indium tin oxide films near their laser damage threshold [Electrical and optical properties of indium tin oxide films under multi-pulse laser irradiation at 1064 nm]. United States. https://doi.org/10.1364/OME.7.000817
Yoo, Jae -Hyuck, Lange, Andrew, Bude, Jeff, and Elhadj, Selim. Fri .
"Optical and electrical properties of indium tin oxide films near their laser damage threshold [Electrical and optical properties of indium tin oxide films under multi-pulse laser irradiation at 1064 nm]". United States. https://doi.org/10.1364/OME.7.000817. https://www.osti.gov/servlets/purl/1345329.
@article{osti_1345329,
title = {Optical and electrical properties of indium tin oxide films near their laser damage threshold [Electrical and optical properties of indium tin oxide films under multi-pulse laser irradiation at 1064 nm]},
author = {Yoo, Jae -Hyuck and Lange, Andrew and Bude, Jeff and Elhadj, Selim},
abstractNote = {In this paper, we investigated whether the optical and electrical properties of indium tin oxide (ITO) films are degraded under laser irradiation below their laser ablation threshold. While performing multi-pulse laser damage experiments on a single ITO film (4.7 ns, 1064 nm, 10 Hz), we examined the optical and electrical properties in situ. A decrease in reflectance was observed prior to laser damage initiation. However, under sub-damage threshold irradiation, conductivity and reflectance of the film were maintained without measurable degradation. This indicates that ITO films in optoelectronic devices may be operated below their lifetime laser damage threshold without noticeable performance degradation.},
doi = {10.1364/OME.7.000817},
journal = {Optical Materials Express},
number = 3,
volume = 7,
place = {United States},
year = {Fri Feb 10 00:00:00 EST 2017},
month = {Fri Feb 10 00:00:00 EST 2017}
}
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Works referencing / citing this record:
A Survey of Transparent Conducting Films and Optoelectrical Materials for High Optical Power Applications
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