Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon
Abstract
Experimental determination of atomistic mechanisms linking crystal structures during a compression driven solid-solid phase transformation is a long standing and challenging scientific objective. Also, when using new capabilities at the Dynamic Compression Sector at the Advanced Photon Source, the structure of shocked Si at 19 GPa was identified as simple hexagonal and the lattice orientations between ambient cubic diamond and simple hexagonal structures were related. Furthermore, this approach is general and provides a powerful new method for examining atomistic mechanisms during stress-induced structural changes.
- Authors:
-
- Washington State Univ., Pullman, WA (United States). Inst. for Shock Physics
- Publication Date:
- Research Org.:
- Washington State Univ., Pullman, WA (United States). Inst. for Shock Physics
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC)
- OSTI Identifier:
- 1334536
- Alternate Identifier(s):
- OSTI ID: 1266410
- Grant/Contract Number:
- NA0002007; NA0002442; AC02-06CH11357
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Physical Review Letters
- Additional Journal Information:
- Journal Volume: 117; Journal Issue: 4; Journal ID: ISSN 0031-9007
- Publisher:
- American Physical Society (APS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 74 ATOMIC AND MOLECULAR PHYSICS; 36 MATERIALS SCIENCE
Citation Formats
Turneaure, Stefan J., Sinclair, N., and Gupta, Y. M. Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon. United States: N. p., 2016.
Web. doi:10.1103/PhysRevLett.117.045502.
Turneaure, Stefan J., Sinclair, N., & Gupta, Y. M. Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon. United States. https://doi.org/10.1103/PhysRevLett.117.045502
Turneaure, Stefan J., Sinclair, N., and Gupta, Y. M. Wed .
"Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon". United States. https://doi.org/10.1103/PhysRevLett.117.045502. https://www.osti.gov/servlets/purl/1334536.
@article{osti_1334536,
title = {Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon},
author = {Turneaure, Stefan J. and Sinclair, N. and Gupta, Y. M.},
abstractNote = {Experimental determination of atomistic mechanisms linking crystal structures during a compression driven solid-solid phase transformation is a long standing and challenging scientific objective. Also, when using new capabilities at the Dynamic Compression Sector at the Advanced Photon Source, the structure of shocked Si at 19 GPa was identified as simple hexagonal and the lattice orientations between ambient cubic diamond and simple hexagonal structures were related. Furthermore, this approach is general and provides a powerful new method for examining atomistic mechanisms during stress-induced structural changes.},
doi = {10.1103/PhysRevLett.117.045502},
journal = {Physical Review Letters},
number = 4,
volume = 117,
place = {United States},
year = {Wed Jul 20 00:00:00 EDT 2016},
month = {Wed Jul 20 00:00:00 EDT 2016}
}
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