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Title: Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure

Abstract

In this study, the Mn K edge X-ray absorption near edge structure (XANES) of Pr0.67Sr0.33MnO3 films with different thicknesses on (001) LaAlO3 substrate were measured, and the effects of strain relaxation on film properties were investigated. The films experienced in-plane compressive strain and out-of-plane tensile strain. Strain relaxation evolved with the film thickness. In the polarization dependent XANES measurements, the in-plane (parallel) and out-of-plane (perpendicular) XANES spectrocopies were anisotropic with different absorption energy Er. The resonance energy Er along two directions shifted towards each other with increasing film thickness. Based on the X-ray diffraction results, it was suggested that the strain relaxation weakened the difference of the local environment and probability of electronic charge transfer (between Mn 3d and O 2p orbitals) along the in-plane and out-of-plane directions, which was responsible for the change of Er. XANES is a useful tool to probe the electronic structures, of which the effects on magnetic properties with the strain relaxation was also been studied.

Authors:
 [1];  [1];  [1];  [2];  [2];  [1];  [1];  [1];  [1]
  1. National Univ. of Singapore (Singapore)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1248885
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 6; Journal Issue: 2; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

zhang, Bangmin, Chen, Jingsheng, Venkatesan, T., Sun, Cheng -Jun, Heald, Steve M., Chow, Gan Moog, Yang, Ping, Chi, Xiao, and Lin, Weinan. Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure. United States: N. p., 2016. Web. doi:10.1038/srep19886.
zhang, Bangmin, Chen, Jingsheng, Venkatesan, T., Sun, Cheng -Jun, Heald, Steve M., Chow, Gan Moog, Yang, Ping, Chi, Xiao, & Lin, Weinan. Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure. United States. https://doi.org/10.1038/srep19886
zhang, Bangmin, Chen, Jingsheng, Venkatesan, T., Sun, Cheng -Jun, Heald, Steve M., Chow, Gan Moog, Yang, Ping, Chi, Xiao, and Lin, Weinan. Thu . "Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure". United States. https://doi.org/10.1038/srep19886. https://www.osti.gov/servlets/purl/1248885.
@article{osti_1248885,
title = {Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure},
author = {zhang, Bangmin and Chen, Jingsheng and Venkatesan, T. and Sun, Cheng -Jun and Heald, Steve M. and Chow, Gan Moog and Yang, Ping and Chi, Xiao and Lin, Weinan},
abstractNote = {In this study, the Mn K edge X-ray absorption near edge structure (XANES) of Pr0.67Sr0.33MnO3 films with different thicknesses on (001) LaAlO3 substrate were measured, and the effects of strain relaxation on film properties were investigated. The films experienced in-plane compressive strain and out-of-plane tensile strain. Strain relaxation evolved with the film thickness. In the polarization dependent XANES measurements, the in-plane (parallel) and out-of-plane (perpendicular) XANES spectrocopies were anisotropic with different absorption energy Er. The resonance energy Er along two directions shifted towards each other with increasing film thickness. Based on the X-ray diffraction results, it was suggested that the strain relaxation weakened the difference of the local environment and probability of electronic charge transfer (between Mn 3d and O 2p orbitals) along the in-plane and out-of-plane directions, which was responsible for the change of Er. XANES is a useful tool to probe the electronic structures, of which the effects on magnetic properties with the strain relaxation was also been studied.},
doi = {10.1038/srep19886},
journal = {Scientific Reports},
number = 2,
volume = 6,
place = {United States},
year = {Thu Jan 28 00:00:00 EST 2016},
month = {Thu Jan 28 00:00:00 EST 2016}
}

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