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Title: GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method

Abstract

In this study, a device and a method for producing ultrashort electron pulses with GHz repetition rates via pulsing an input direct current (dc) electron beam are provided. The device and the method are based on an electromagnetic-mechanical pulser (EMMP) that consists of a series of transverse deflecting cavities and magnetic quadrupoles. The EMMP modulates and chops the incoming dc electron beam and converts it into pico- and sub-pico-second electron pulse sequences (pulse trains) at >1 GHz repetition rates, as well as controllably manipulates the resulting pulses. Ultimately, it leads to negligible electron pulse phase-space degradation compared to the incoming dc beam parameters. The temporal pulse length and repetition rate for the EMMP can be continuously tunable over wide ranges.

Authors:
 [1];  [2];  [1];  [1];  [1];  [3];  [4]
+ Show Author Affiliations
  1. Euclid TechLabs, Bolingbrook, IL (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Integrated Dynamic Electron Solutions, Pleasanton, CA (United States)
  4. National Institute of Standards and Technology, Gaithersburg, MD (United States)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1240700
Alternate Identifier(s):
OSTI ID: 1396434
Report Number(s):
BNL-111862-2016-JA
Journal ID: ISSN 0304-3991; R&D Project: MA015MACA; KC0201010
Grant/Contract Number:  
SC00112704; SC0013121; SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 161; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; GHz; stroboscopic; deflecting cavity; transmission electron microscopy; time-resolved; ultrafast

Citation Formats

Qiu, Jiaqi, Zhu, Yimei, Ha, Gwanghui, Jing, Chunguang, Baryshev, Sergey V., Reed, Bryan W., and Lau, June W. GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method. United States: N. p., 2015. Web. doi:10.1016/j.ultramic.2015.11.006.
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Qiu, Jiaqi, Zhu, Yimei, Ha, Gwanghui, Jing, Chunguang, Baryshev, Sergey V., Reed, Bryan W., & Lau, June W. GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method. United States. https://doi.org/10.1016/j.ultramic.2015.11.006
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Qiu, Jiaqi, Zhu, Yimei, Ha, Gwanghui, Jing, Chunguang, Baryshev, Sergey V., Reed, Bryan W., and Lau, June W. Tue . "GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method". United States. https://doi.org/10.1016/j.ultramic.2015.11.006. https://www.osti.gov/servlets/purl/1240700.
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@article{osti_1240700,
title = {GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method},
author = {Qiu, Jiaqi and Zhu, Yimei and Ha, Gwanghui and Jing, Chunguang and Baryshev, Sergey V. and Reed, Bryan W. and Lau, June W.},
abstractNote = {In this study, a device and a method for producing ultrashort electron pulses with GHz repetition rates via pulsing an input direct current (dc) electron beam are provided. The device and the method are based on an electromagnetic-mechanical pulser (EMMP) that consists of a series of transverse deflecting cavities and magnetic quadrupoles. The EMMP modulates and chops the incoming dc electron beam and converts it into pico- and sub-pico-second electron pulse sequences (pulse trains) at >1 GHz repetition rates, as well as controllably manipulates the resulting pulses. Ultimately, it leads to negligible electron pulse phase-space degradation compared to the incoming dc beam parameters. The temporal pulse length and repetition rate for the EMMP can be continuously tunable over wide ranges.},
doi = {10.1016/j.ultramic.2015.11.006},
journal = {Ultramicroscopy},
number = C,
volume = 161,
place = {United States},
year = {Tue Nov 10 00:00:00 EST 2015},
month = {Tue Nov 10 00:00:00 EST 2015}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1016/j.ultramic.2015.11.006
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    journal, May 2017

    • Schliep, Karl B.; Quarterman, P.; Wang, Jian-Ping
    • Applied Physics Letters, Vol. 110, Issue 22
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    Design and characterization of dielectric filled TM 110 microwave cavities for ultrafast electron microscopy
    journal, August 2019

    • Verhoeven, W.; van Rens, J. F. M.; Kemper, A. H.
    • Review of Scientific Instruments, Vol. 90, Issue 8
    • DOI: 10.1063/1.5080003

    Atomic-scale imaging of ultrafast materials dynamics
    journal, July 2018

    • Flannigan, David J.; Lindenberg, Aaron M.
    • MRS Bulletin, Vol. 43, Issue 7
    • DOI: 10.1557/mrs.2018.146
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