Evaluation of commercial ADC radiation tolerance for accelerator experiments

Chen, K.; Chen, H.; Kierstead, J.; Takai, H.; Rescia, S.; Hu, X.; Xu, H.; Mead, J.; Lanni, F.; Minelli, M.

doi:10.1088/1748-0221/10/08/P08009

Title: Evaluation of commercial ADC radiation tolerance for accelerator experiments

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Abstract

Electronic components used in high energy physics experiments are subjected to a radiation background composed of high energy hadrons, mesons and photons. These particles can induce permanent and transient effects that affect the normal device operation. Ionizing dose and displacement damage can cause chronic damage which disable the device permanently. Transient effects or single event effects are in general recoverable with time intervals that depend on the nature of the failure. The magnitude of these effects is technology dependent with feature size being one of the key parameters. Analog to digital converters are components that are frequently used in detector front end electronics, generally placed as close as possible to the sensing elements to maximize signal fidelity. We report on radiation effects tests conducted on 17 commercially available analog to digital converters and extensive single event effect measurements on specific twelve and fourteen bit ADCs that presented high tolerance to ionizing dose. We discuss mitigation strategies for single event effects (SEE) for their use in the large hadron collider environment.

Authors:: Chen, K.; Chen, H.; Kierstead, J.; Takai, H.; Rescia, S.; Hu, X.; Xu, H.; Mead, J.; Lanni, F.; Minelli, M.

Publication Date:: Mon Aug 17 00:00:00 EDT 2015

Research Org.:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Org.:: USDOE Office of Science (SC), High Energy Physics (HEP)

OSTI Identifier:: 1239780

Report Number(s):: BNL-111640-2015-JA
Journal ID: ISSN 1748-0221; KA2101020; TRN: US1600707

Grant/Contract Number:: AC02-98CH10886; SC00112704

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Instrumentation

Additional Journal Information:: Journal Volume: 10; Journal Issue: 08; Journal ID: ISSN 1748-0221

Publisher:: Institute of Physics (IOP)

Country of Publication:: United States

Language:: English

Subject:: 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; Radiation damage to electronic components; Radiation damage evaluation methods; Front-end electronics for detector readout.

Citation Formats


                    Chen, K., Chen, H., Kierstead, J., Takai, H., Rescia, S., Hu, X., Xu, H., Mead, J., Lanni, F., and Minelli, M. Evaluation of commercial ADC radiation tolerance for accelerator experiments.  United States: N. p., 2015. 
Web.  doi:10.1088/1748-0221/10/08/P08009.

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                    Chen, K., Chen, H., Kierstead, J., Takai, H., Rescia, S., Hu, X., Xu, H., Mead, J., Lanni, F., & Minelli, M. Evaluation of commercial ADC radiation tolerance for accelerator experiments.  United States.  https://doi.org/10.1088/1748-0221/10/08/P08009

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                    Chen, K., Chen, H., Kierstead, J., Takai, H., Rescia, S., Hu, X., Xu, H., Mead, J., Lanni, F., and Minelli, M. Mon .  
"Evaluation of commercial ADC radiation tolerance for accelerator experiments".  United States.  https://doi.org/10.1088/1748-0221/10/08/P08009.  https://www.osti.gov/servlets/purl/1239780.

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@article{osti_1239780,

  title        = {Evaluation of commercial ADC radiation tolerance for accelerator experiments},

  author       = {Chen, K. and Chen, H. and Kierstead, J. and Takai, H. and Rescia, S. and Hu, X. and Xu, H. and Mead, J. and Lanni, F. and Minelli, M.},

  abstractNote = {Electronic components used in high energy physics experiments are subjected to a radiation background composed of high energy hadrons, mesons and photons. These particles can induce permanent and transient effects that affect the normal device operation. Ionizing dose and displacement damage can cause chronic damage which disable the device permanently. Transient effects or single event effects are in general recoverable with time intervals that depend on the nature of the failure. The magnitude of these effects is technology dependent with feature size being one of the key parameters. Analog to digital converters are components that are frequently used in detector front end electronics, generally placed as close as possible to the sensing elements to maximize signal fidelity. We report on radiation effects tests conducted on 17 commercially available analog to digital converters and extensive single event effect measurements on specific twelve and fourteen bit ADCs that presented high tolerance to ionizing dose. We discuss mitigation strategies for single event effects (SEE) for their use in the large hadron collider environment.},

  doi          = {10.1088/1748-0221/10/08/P08009},

  journal      = {Journal of Instrumentation},

  number       = 08,

  volume       = 10,

  place        = {United States},

  year         = {Mon Aug 17 00:00:00 EDT 2015},

  month        = {Mon Aug 17 00:00:00 EDT 2015}

}

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