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Title: Efficiency of a multilayer-Laue-lens with a 102 μm aperture

Abstract

A multilayer-Laue-lens (MLL) comprised of WSi2/Al layers stacked to a full thickness of 102 microns was characterized for its diffraction efficiency and dynamical diffraction properties by x-ray measurements made in the far field. The achieved aperture roughly doubles the previous maximum reported aperture for an MLL, thereby doubling the working distance. Negative and positive first orders were found to have 14.2 % and 13.0 % efficiencies, respectively. A section thickness of 9.6 μm was determined from Laue-case thickness fringes in the diffraction data. A background gas consisting of 90 % Ar and 10 % N2 was used for sputtering. This material system was chosen to reduce grown-in stress as the multilayer is deposited. Although some regions of the full MLL exhibited defects, the presently reported results were obtained for a region devoid of defects. The data compare well to dynamical diffraction calculations with Coupled Wave Theory (CWT) which provided confirmation of the optical constants and densities assumed for the CWT calculations.

Authors:
 [1];  [2];  [3];  [4];  [4];  [1];  [1]
+ Show Author Affiliations
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source; Fraunhofer IWS Dresden (Germany)
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source; Brookhaven National Lab. (BNL), Upton, NY (United States)
  4. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1239773
Alternate Identifier(s):
OSTI ID: 1229639
Report Number(s):
BNL-108332-2015-JA
Journal ID: ISSN 0003-6951; APPLAB; R&D Project: LS001
Grant/Contract Number:  
SC00112704; AC-02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 107; Journal Issue: 8; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Macrander, Albert T., Kubec, Adam, Conley, Raymond, Bouet, Nathalie, Zhou, Juan, Wojcik, Michael, and Maser, Jorg. Efficiency of a multilayer-Laue-lens with a 102 μm aperture. United States: N. p., 2015. Web. doi:10.1063/1.4929505.
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Macrander, Albert T., Kubec, Adam, Conley, Raymond, Bouet, Nathalie, Zhou, Juan, Wojcik, Michael, & Maser, Jorg. Efficiency of a multilayer-Laue-lens with a 102 μm aperture. United States. https://doi.org/10.1063/1.4929505
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Macrander, Albert T., Kubec, Adam, Conley, Raymond, Bouet, Nathalie, Zhou, Juan, Wojcik, Michael, and Maser, Jorg. Tue . "Efficiency of a multilayer-Laue-lens with a 102 μm aperture". United States. https://doi.org/10.1063/1.4929505. https://www.osti.gov/servlets/purl/1239773.
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@article{osti_1239773,
title = {Efficiency of a multilayer-Laue-lens with a 102 μm aperture},
author = {Macrander, Albert T. and Kubec, Adam and Conley, Raymond and Bouet, Nathalie and Zhou, Juan and Wojcik, Michael and Maser, Jorg},
abstractNote = {A multilayer-Laue-lens (MLL) comprised of WSi2/Al layers stacked to a full thickness of 102 microns was characterized for its diffraction efficiency and dynamical diffraction properties by x-ray measurements made in the far field. The achieved aperture roughly doubles the previous maximum reported aperture for an MLL, thereby doubling the working distance. Negative and positive first orders were found to have 14.2 % and 13.0 % efficiencies, respectively. A section thickness of 9.6 μm was determined from Laue-case thickness fringes in the diffraction data. A background gas consisting of 90 % Ar and 10 % N2 was used for sputtering. This material system was chosen to reduce grown-in stress as the multilayer is deposited. Although some regions of the full MLL exhibited defects, the presently reported results were obtained for a region devoid of defects. The data compare well to dynamical diffraction calculations with Coupled Wave Theory (CWT) which provided confirmation of the optical constants and densities assumed for the CWT calculations.},
doi = {10.1063/1.4929505},
journal = {Applied Physics Letters},
number = 8,
volume = 107,
place = {United States},
year = {Tue Aug 25 00:00:00 EDT 2015},
month = {Tue Aug 25 00:00:00 EDT 2015}
}
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https://doi.org/10.1063/1.4929505
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Works referenced in this record:

Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens
journal, January 2015

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Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer
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journal, August 2014

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    Works referencing / citing this record:

    Interlaced zone plate optics for hard X-ray imaging in the 10 nm range
    journal, March 2017

    • Mohacsi, Istvan; Vartiainen, Ismo; Rösner, Benedikt
    • Scientific Reports, Vol. 7, Issue 1
    • DOI: 10.1038/srep43624

    Multilayer Laue Lens: A Brief History and Current Status
    journal, July 2016

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