Method for analyzing passive silicon carbide thermometry with a continuous dilatometer to determine irradiation temperature
Abstract
Silicon carbide is used as a passive post-irradiation temperature monitor because the irradiation defects will anneal out above the irradiation temperature. The irradiation temperature is determined by measuring a property change after isochronal annealing, i.e., lattice spacing, dimensions, electrical resistivity, thermal diffusivity, or bulk density. However, such methods are time-consuming since the steps involved must be performed in a serial manner. This work presents the use of thermal expansion from continuous dilatometry to calculate the SiC irradiation temperature, which is an automated process requiring minimal setup time. Analysis software was written that performs the calculations to obtain the irradiation temperature and removes possible user-introduced error while standardizing the analysis. In addition, this method has been compared to an electrical resistivity and isochronal annealing investigation, and the results revealed agreement of the calculated temperatures. These results show that dilatometry is a reliable and less time-intensive process for determining irradiation temperature from passive SiC thermometry.
- Authors:
-
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Fusion Energy Sciences (FES)
- OSTI Identifier:
- 1236583
- Alternate Identifier(s):
- OSTI ID: 1359672
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Additional Journal Information:
- Journal Volume: 370; Journal Issue: C; Journal ID: ISSN 0168-583X
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; silicon carbide; passive irradiation temperature monitor; dilatometry; annealing
Citation Formats
Campbell, Anne A., Porter, Wallace D., Katoh, Yutai, and Snead, Lance Lewis. Method for analyzing passive silicon carbide thermometry with a continuous dilatometer to determine irradiation temperature. United States: N. p., 2016.
Web. doi:10.1016/j.nimb.2016.01.005.
Campbell, Anne A., Porter, Wallace D., Katoh, Yutai, & Snead, Lance Lewis. Method for analyzing passive silicon carbide thermometry with a continuous dilatometer to determine irradiation temperature. United States. https://doi.org/10.1016/j.nimb.2016.01.005
Campbell, Anne A., Porter, Wallace D., Katoh, Yutai, and Snead, Lance Lewis. Thu .
"Method for analyzing passive silicon carbide thermometry with a continuous dilatometer to determine irradiation temperature". United States. https://doi.org/10.1016/j.nimb.2016.01.005. https://www.osti.gov/servlets/purl/1236583.
@article{osti_1236583,
title = {Method for analyzing passive silicon carbide thermometry with a continuous dilatometer to determine irradiation temperature},
author = {Campbell, Anne A. and Porter, Wallace D. and Katoh, Yutai and Snead, Lance Lewis},
abstractNote = {Silicon carbide is used as a passive post-irradiation temperature monitor because the irradiation defects will anneal out above the irradiation temperature. The irradiation temperature is determined by measuring a property change after isochronal annealing, i.e., lattice spacing, dimensions, electrical resistivity, thermal diffusivity, or bulk density. However, such methods are time-consuming since the steps involved must be performed in a serial manner. This work presents the use of thermal expansion from continuous dilatometry to calculate the SiC irradiation temperature, which is an automated process requiring minimal setup time. Analysis software was written that performs the calculations to obtain the irradiation temperature and removes possible user-introduced error while standardizing the analysis. In addition, this method has been compared to an electrical resistivity and isochronal annealing investigation, and the results revealed agreement of the calculated temperatures. These results show that dilatometry is a reliable and less time-intensive process for determining irradiation temperature from passive SiC thermometry.},
doi = {10.1016/j.nimb.2016.01.005},
journal = {Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms},
number = C,
volume = 370,
place = {United States},
year = {Thu Jan 14 00:00:00 EST 2016},
month = {Thu Jan 14 00:00:00 EST 2016}
}
Web of Science
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Works referencing / citing this record:
Raman spectroscopy of neutron irradiated silicon carbide: Correlation among Raman spectra, swelling, and irradiation temperature
journal, July 2018
- Koyanagi, Takaaki; Katoh, Yutai; Lance, Michael J.
- Journal of Raman Spectroscopy, Vol. 49, Issue 10
Response of isotopically tailored titanium diboride to neutron irradiation
journal, September 2018
- Koyanagi, Takaaki; Katoh, Yutai; Ang, Caen
- Journal of the American Ceramic Society, Vol. 102, Issue 1