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Title: Soft x-ray free-electron laser induced damage to inorganic scintillators

Abstract

An irreversible response of inorganic scintillators to intense soft x-ray laser radiation was investigated at the FLASH (Free-electron LASer in Hamburg) facility. Three ionic crystals, namely, Ce:YAG (cerium-doped yttrium aluminum garnet), PbWO4 (lead tungstate), and ZnO (zinc oxide), were exposed to single 4.6 nm ultra-short laser pulses of variable pulse energy (up to 12 μJ) under normal incidence conditions with tight focus. Damaged areas produced with various levels of pulse fluences, were analyzed on the surface of irradiated samples using differential interference contrast (DIC) and atomic force microscopy (AFM). The effective beam area of 22.2 ± 2.2 μm2 was determined by means of the ablation imprints method with the use of poly(methyl methacrylate) - PMMA. Applied to the three inorganic materials, this procedure gave almost the same values of an effective area. The single-shot damage threshold fluence was determined for each of these inorganic materials. The Ce:YAG sample seems to be the most radiation resistant under the given irradiation conditions, its damage threshold was determined to be as high as 660.8 ± 71.2 mJ/cm2. Contrary to that, the PbWO4 sample exhibited the lowest radiation resistance with a threshold fluence of 62.6 ± 11.9 mJ/cm2. The threshold for ZnO was foundmore » to be 167.8 ± 30.8 mJ/cm2. Both interaction and material characteristics responsible for the damage threshold difference are discussed in the article.« less

Authors:
 [1];  [2];  [2];  [2];  [2];  [2];  [3];  [4];  [5];  [5];  [6];  [5];  [5];  [7];  [8];  [8];  [8];  [9];  [10];  [11] more »;  [11];  [12];  [12];  [13];  [14];  [15];  [16];  [17];  [2] « less
+ Show Author Affiliations
  1. Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic). Inst. of Physics; Charles Univ. (Czech Republic)
  2. Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic). Inst. of Physics
  3. Charles Univ. (Czech Republic)
  4. Paul Scherrer Inst. (PSI), Villigen (Switzerland); European XFEL CmbH, Hamburg (Germany)
  5. European XFEL CmbH, Hamburg (Germany)
  6. European XFEL CmbH, Hamburg (Germany); Center for Free-Electron Laser Science, Hamburg (Germany)
  7. Univ. Bordeaux (France)
  8. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  9. Center for Free-Electron Laser Science, Hamburg (Germany); Univ. of Hamburg (Germany)
  10. Center for Free-Electron Laser Science, Hamburg (Germany); FOM Inst. DIFFER (The Netherlands)
  11. Polish Academy of Sciences (PAS), Warsaw (Poland)
  12. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  13. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Inst. de minéralogie, Paris (France)
  14. Technische Univ. Wien (Germany)
  15. RIKEN, Hyogo (Japan)
  16. Slovak Academy of Sciences (Slovak Republic)
  17. P. J. Šafárik Univ. (Slovak Republic)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1223351
Grant/Contract Number:  
P108/11/1312
Resource Type:
Accepted Manuscript
Journal Name:
Optical Materials Express
Additional Journal Information:
Journal Volume: 5; Journal Issue: 2; Journal ID: ISSN 2159-3930
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE

Citation Formats

Burian, Tomáš, Hájková, Věra, Chalupský, Jaromír, Vyšín, Luděk, Boháček, Pavel, Přeček, Martin, Wild, Jan, Özkan, Cigdem, Coppola, Nicola, Farahani, Shafagh Dastjani, Schulz, Joachim, Sinn, Harald, Tschentscher, Thomas, Gaudin, Jérôme, Bajt, Saša, Tiedtke, Kai, Toleikis, Sven, Chapman, Henry N., Loch, Rolf A., Jurek, Marek, Sobierajski, Ryszard, Krzywinski, Jacek, Moeller, Stefan, Harmand, Marion, Galasso, Germano, Nagasono, Mitsuru, Saskl, Karel, Sovák, Pavol, and Juha, Libor. Soft x-ray free-electron laser induced damage to inorganic scintillators. United States: N. p., 2015. Web. doi:10.1364/OME.5.000254.
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Burian, Tomáš, Hájková, Věra, Chalupský, Jaromír, Vyšín, Luděk, Boháček, Pavel, Přeček, Martin, Wild, Jan, Özkan, Cigdem, Coppola, Nicola, Farahani, Shafagh Dastjani, Schulz, Joachim, Sinn, Harald, Tschentscher, Thomas, Gaudin, Jérôme, Bajt, Saša, Tiedtke, Kai, Toleikis, Sven, Chapman, Henry N., Loch, Rolf A., Jurek, Marek, Sobierajski, Ryszard, Krzywinski, Jacek, Moeller, Stefan, Harmand, Marion, Galasso, Germano, Nagasono, Mitsuru, Saskl, Karel, Sovák, Pavol, & Juha, Libor. Soft x-ray free-electron laser induced damage to inorganic scintillators. United States. https://doi.org/10.1364/OME.5.000254
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Burian, Tomáš, Hájková, Věra, Chalupský, Jaromír, Vyšín, Luděk, Boháček, Pavel, Přeček, Martin, Wild, Jan, Özkan, Cigdem, Coppola, Nicola, Farahani, Shafagh Dastjani, Schulz, Joachim, Sinn, Harald, Tschentscher, Thomas, Gaudin, Jérôme, Bajt, Saša, Tiedtke, Kai, Toleikis, Sven, Chapman, Henry N., Loch, Rolf A., Jurek, Marek, Sobierajski, Ryszard, Krzywinski, Jacek, Moeller, Stefan, Harmand, Marion, Galasso, Germano, Nagasono, Mitsuru, Saskl, Karel, Sovák, Pavol, and Juha, Libor. Wed . "Soft x-ray free-electron laser induced damage to inorganic scintillators". United States. https://doi.org/10.1364/OME.5.000254. https://www.osti.gov/servlets/purl/1223351.
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@article{osti_1223351,
title = {Soft x-ray free-electron laser induced damage to inorganic scintillators},
author = {Burian, Tomáš and Hájková, Věra and Chalupský, Jaromír and Vyšín, Luděk and Boháček, Pavel and Přeček, Martin and Wild, Jan and Özkan, Cigdem and Coppola, Nicola and Farahani, Shafagh Dastjani and Schulz, Joachim and Sinn, Harald and Tschentscher, Thomas and Gaudin, Jérôme and Bajt, Saša and Tiedtke, Kai and Toleikis, Sven and Chapman, Henry N. and Loch, Rolf A. and Jurek, Marek and Sobierajski, Ryszard and Krzywinski, Jacek and Moeller, Stefan and Harmand, Marion and Galasso, Germano and Nagasono, Mitsuru and Saskl, Karel and Sovák, Pavol and Juha, Libor},
abstractNote = {An irreversible response of inorganic scintillators to intense soft x-ray laser radiation was investigated at the FLASH (Free-electron LASer in Hamburg) facility. Three ionic crystals, namely, Ce:YAG (cerium-doped yttrium aluminum garnet), PbWO4 (lead tungstate), and ZnO (zinc oxide), were exposed to single 4.6 nm ultra-short laser pulses of variable pulse energy (up to 12 μJ) under normal incidence conditions with tight focus. Damaged areas produced with various levels of pulse fluences, were analyzed on the surface of irradiated samples using differential interference contrast (DIC) and atomic force microscopy (AFM). The effective beam area of 22.2 ± 2.2 μm2 was determined by means of the ablation imprints method with the use of poly(methyl methacrylate) - PMMA. Applied to the three inorganic materials, this procedure gave almost the same values of an effective area. The single-shot damage threshold fluence was determined for each of these inorganic materials. The Ce:YAG sample seems to be the most radiation resistant under the given irradiation conditions, its damage threshold was determined to be as high as 660.8 ± 71.2 mJ/cm2. Contrary to that, the PbWO4 sample exhibited the lowest radiation resistance with a threshold fluence of 62.6 ± 11.9 mJ/cm2. The threshold for ZnO was found to be 167.8 ± 30.8 mJ/cm2. Both interaction and material characteristics responsible for the damage threshold difference are discussed in the article.},
doi = {10.1364/OME.5.000254},
journal = {Optical Materials Express},
number = 2,
volume = 5,
place = {United States},
year = {Wed Jan 07 00:00:00 EST 2015},
month = {Wed Jan 07 00:00:00 EST 2015}
}
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https://doi.org/10.1364/OME.5.000254
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Works referenced in this record:

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    Works referencing / citing this record:

    Saturation of a Ce:Y$_{3}$Al$_{5}$O$_{12}$ scintillator response to ultra-short pulses of extreme ultraviolet soft X-ray and X-ray laser radiation
    text, January 2017

    • Krzywinski, J.; Andrejczuk, A.; Bionta, R. M.
    • Deutsches Elektronen-Synchrotron, DESY, Hamburg
    • DOI: 10.3204/pubdb-2018-00266
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