Title: Single-shot Z_eff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer

Abstract

The Talbot–Lau x-ray moiré deflectometer is a powerful plasma diagnostic capable of delivering simultaneous refraction and attenuation information through the accurate detection of x-ray phase shift and intensity. The diagnostic can provide the index of refraction n=1₋δ + iβ of an object (dense plasma, for example) placed in the x-ray beam by independently measuring both δ and β, which are directly related to the electron density n_e and the attenuation coefficient μ respectively. Since δ and β depend on the effective atomic number Z _eff, a map can be obtained from the ratio between phase and absorption images acquired in a single shot. The Talbot–Lau x-ray moiré deflectometer and its corresponding data acquisition and processing are briefly described to illustrate how the above is achieved; Z _eff values of test objects within the 4₋12 range were obtained experimentally through simultaneous refraction and attenuation measurements. We show that Z _eff mapping of objects does not require previous knowledge of sample length or shape. In conclusion, the determination of Z _eff from refraction and attenuation measurements with moiré deflectometry could be of high interest to various domains of high energy density research, such as shocked materials and inertial confinement fusion experiments, asmore » well as material science and nondestructive testing.« less

Authors:

Valdivia, M. P. ^[1]; Stutman, D. ^[1]; Finkenthal, M. ^[1]

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+ Show Author Affiliations

1. John Hopkins Univ., Baltimore, MD (United States)

Publication Date:

Mon Mar 23 00:00:00 EDT 2015

Research Org.:

Johns Hopkins Univ., Baltimore, MD (United States). Dept. of Physics and Astronomy

Sponsoring Org.:

USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:

1223269

Alternate Identifier(s):

OSTI ID: 1258589

Grant/Contract Number:  

NA0001835

Resource Type:

Accepted Manuscript

Journal Name:

Applied Optics

Additional Journal Information:

Journal Volume: 54; Journal Issue: 10; Journal ID: ISSN 0003-6935

Publisher:

Optical Society of America (OSA)

Country of Publication:

United States

Language:

English

Subject:

70 PLASMA PHYSICS AND FUSION TECHNOLOGY; Moiré techniques; X-ray imaging; Phase shift; 47 OTHER INSTRUMENTATION