Title: X-ray Moiré deflectometry using synthetic reference images

Abstract

Moiré fringe deflectometry with grating interferometers is a technique that enables refraction-based x-ray imaging using a single exposure of an object. To obtain the refraction image, the method requires a reference fringe pattern (without the object). Our study shows that, in order to avoid artifacts, the reference pattern must be exactly matched in phase with the object fringe pattern. In experiments, however, it is difficult to produce a perfectly matched reference pattern due to unavoidable interferometer drifts. We present a simple method to obtain matched reference patterns using a phase-scan procedure to generate synthetic Moiré images. As a result, the method will enable deflectometric diagnostics of transient phenomena such as laser-produced plasmas and could improve the sensitivity and accuracy of medical phase-contrast imaging.

Authors:

Stutman, Dan ^[1]; Valdivia, Maria Pia ^[1]; Finkenthal, Michael ^[1]

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+ Show Author Affiliations

1. Johns Hopkins Univ., Baltimore, MD (United States)

Publication Date:

Thu Jun 25 00:00:00 EDT 2015

Research Org.:

Johns Hopkins Univ., Baltimore, MD (United States)

Sponsoring Org.:

USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:

1223268

Alternate Identifier(s):

OSTI ID: 1222257

Grant/Contract Number:  

NA0001835; DENA0001B35

Resource Type:

Accepted Manuscript

Journal Name:

Applied Optics

Additional Journal Information:

Journal Volume: 54; Journal Issue: 19; Journal ID: ISSN 0003-6935

Publisher:

Optical Society of America (OSA)

Country of Publication:

United States

Language:

English

Subject:

70 PLASMA PHYSICS AND FUSION TECHNOLOGY; X-ray interferometry; phase retrieval; X-ray imaging