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Title: Elucidation of perovskite film micro-orientations using two-photon total internal reflectance fluorescence microscopy

Abstract

The emergence of efficient hybrid organic-inorganic perovskite photovoltaic materials has caused the rapid development of a variety of preparation and processing techniques designed to maximize their performance. As processing methods continue to emerge, it is important to understand how the optical properties of these materials are affected on a microscopic scale. Here polarization resolved two-photon total internal reflectance microscopy (TIRFM) was used to probe changes in transition dipole moment orientation as a function of thermal annealing time in hybrid organic-inorganic lead iodide based perovskite (CH3NH3PbI3) thin films on glass. These results show that as thermal annealing time is increased the distribution of transition moments pointing out-of-plane decreases in favor of forming areas with increased in-plane orientations. As a result, it was also shown through the axial sensitivity of TIRFM that the surface topography is manifested in the signal intensity and can be used to survey aspects of morphology in coincidence with the optical properties of these films.

Authors:
 [1];  [2];  [2];  [2];  [2];  [1]
  1. Univ. of Tennessee, Knoxville, TN (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1214027
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Physical Chemistry Letters
Additional Journal Information:
Journal Volume: 6; Journal Issue: 16; Journal ID: ISSN 1948-7185
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; perovskite

Citation Formats

Watson, Brianna R., Yang, Bin, Xiao, Kai, Ma, Ying -Zhong, Doughty, Benjamin L., and Calhoun, Tessa R. Elucidation of perovskite film micro-orientations using two-photon total internal reflectance fluorescence microscopy. United States: N. p., 2015. Web. doi:10.1021/acs.jpclett.5b01474.
Watson, Brianna R., Yang, Bin, Xiao, Kai, Ma, Ying -Zhong, Doughty, Benjamin L., & Calhoun, Tessa R. Elucidation of perovskite film micro-orientations using two-photon total internal reflectance fluorescence microscopy. United States. https://doi.org/10.1021/acs.jpclett.5b01474
Watson, Brianna R., Yang, Bin, Xiao, Kai, Ma, Ying -Zhong, Doughty, Benjamin L., and Calhoun, Tessa R. Wed . "Elucidation of perovskite film micro-orientations using two-photon total internal reflectance fluorescence microscopy". United States. https://doi.org/10.1021/acs.jpclett.5b01474. https://www.osti.gov/servlets/purl/1214027.
@article{osti_1214027,
title = {Elucidation of perovskite film micro-orientations using two-photon total internal reflectance fluorescence microscopy},
author = {Watson, Brianna R. and Yang, Bin and Xiao, Kai and Ma, Ying -Zhong and Doughty, Benjamin L. and Calhoun, Tessa R.},
abstractNote = {The emergence of efficient hybrid organic-inorganic perovskite photovoltaic materials has caused the rapid development of a variety of preparation and processing techniques designed to maximize their performance. As processing methods continue to emerge, it is important to understand how the optical properties of these materials are affected on a microscopic scale. Here polarization resolved two-photon total internal reflectance microscopy (TIRFM) was used to probe changes in transition dipole moment orientation as a function of thermal annealing time in hybrid organic-inorganic lead iodide based perovskite (CH3NH3PbI3) thin films on glass. These results show that as thermal annealing time is increased the distribution of transition moments pointing out-of-plane decreases in favor of forming areas with increased in-plane orientations. As a result, it was also shown through the axial sensitivity of TIRFM that the surface topography is manifested in the signal intensity and can be used to survey aspects of morphology in coincidence with the optical properties of these films.},
doi = {10.1021/acs.jpclett.5b01474},
journal = {Journal of Physical Chemistry Letters},
number = 16,
volume = 6,
place = {United States},
year = {Wed Jul 29 00:00:00 EDT 2015},
month = {Wed Jul 29 00:00:00 EDT 2015}
}

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