High numerical aperture multilayer Laue lenses
Abstract
The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilise their capability for imaging and probing biological cells, nanodevices, and functional matter on the nanometer scale with chemical sensitivity. Here we demonstrate focusing a hard X-ray beam to an 8 nm focus using a volume zone plate (also referred to as a wedged multilayer Laue lens). This lens was constructed using a new deposition technique that enabled the independent control of the angle and thickness of diffracting layers to microradian and nanometer precision, respectively. This ensured that the Bragg condition is satisfied at each point along the lens, leading to a high numerical aperture that is limited only by its extent. We developed a phase-shifting interferometric method based on ptychography to characterise the lens focus. The precision of the fabrication and characterisation demonstrated here provides the path to efficient X-ray optics for imaging at 1 nm resolution.
- Authors:
-
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- Univ. of Bialystok (Poland)
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Hamburg (Germany).
- Eurpean XFEL GmbH, Hamburg (Germany)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Centre for Ultrafast Umaging, Hamburg (Germany); Univ. of Hamburg (Germany).
- Publication Date:
- Research Org.:
- SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1208858
- Grant/Contract Number:
- AC03-76SF00515
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Volume: 5; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Morgan, Andrew J., Prasciolu, Mauro, Andrejczuk, Andrzej, Krzywinski, Jacek, Meents, Alke, Pennicard, David, Graafsma, Heinz, Barty, Anton, Bean, Richard J., Barthelmess, Miriam, Oberthuer, Dominik, Yefanov, Oleksandr, Aquila, Andrew, Chapman, Henry N., and Bajt, Saša. High numerical aperture multilayer Laue lenses. United States: N. p., 2015.
Web. doi:10.1038/srep09892.
Morgan, Andrew J., Prasciolu, Mauro, Andrejczuk, Andrzej, Krzywinski, Jacek, Meents, Alke, Pennicard, David, Graafsma, Heinz, Barty, Anton, Bean, Richard J., Barthelmess, Miriam, Oberthuer, Dominik, Yefanov, Oleksandr, Aquila, Andrew, Chapman, Henry N., & Bajt, Saša. High numerical aperture multilayer Laue lenses. United States. https://doi.org/10.1038/srep09892
Morgan, Andrew J., Prasciolu, Mauro, Andrejczuk, Andrzej, Krzywinski, Jacek, Meents, Alke, Pennicard, David, Graafsma, Heinz, Barty, Anton, Bean, Richard J., Barthelmess, Miriam, Oberthuer, Dominik, Yefanov, Oleksandr, Aquila, Andrew, Chapman, Henry N., and Bajt, Saša. Mon .
"High numerical aperture multilayer Laue lenses". United States. https://doi.org/10.1038/srep09892. https://www.osti.gov/servlets/purl/1208858.
@article{osti_1208858,
title = {High numerical aperture multilayer Laue lenses},
author = {Morgan, Andrew J. and Prasciolu, Mauro and Andrejczuk, Andrzej and Krzywinski, Jacek and Meents, Alke and Pennicard, David and Graafsma, Heinz and Barty, Anton and Bean, Richard J. and Barthelmess, Miriam and Oberthuer, Dominik and Yefanov, Oleksandr and Aquila, Andrew and Chapman, Henry N. and Bajt, Saša},
abstractNote = {The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilise their capability for imaging and probing biological cells, nanodevices, and functional matter on the nanometer scale with chemical sensitivity. Here we demonstrate focusing a hard X-ray beam to an 8 nm focus using a volume zone plate (also referred to as a wedged multilayer Laue lens). This lens was constructed using a new deposition technique that enabled the independent control of the angle and thickness of diffracting layers to microradian and nanometer precision, respectively. This ensured that the Bragg condition is satisfied at each point along the lens, leading to a high numerical aperture that is limited only by its extent. We developed a phase-shifting interferometric method based on ptychography to characterise the lens focus. The precision of the fabrication and characterisation demonstrated here provides the path to efficient X-ray optics for imaging at 1 nm resolution.},
doi = {10.1038/srep09892},
journal = {Scientific Reports},
number = ,
volume = 5,
place = {United States},
year = {Mon Jun 01 00:00:00 EDT 2015},
month = {Mon Jun 01 00:00:00 EDT 2015}
}
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