Quantum metrology of low-frequency electromagnetic modes with frequency upconverters

Kuenstner, Stephen E.; van Assendelft, Elizabeth C.; Chaudhuri, Saptarshi; Cho, Hsiao-Mei; Corbin, Jason; Henderson, Shawn W.; Kadribasic, Fedja; Li, Dale; Phipps, Arran; Rapidis, Nicholas M.; Simanovskaia, Maria; Singh, Jyotirmai; Yu, Cyndia; Irwin, Kent D.

doi:10.1103/PhysRevResearch.7.013281

Title: Quantum metrology of low-frequency electromagnetic modes with frequency upconverters

Journal Article · 17 March 2025 · Physical Review Research

DOI: https://doi.org/10.1103/PhysRevResearch.7.013281 · OSTI ID:2531025

;

; Cho, Hsiao-Mei; Corbin, Jason;

;

; Li, Dale;

;

; Simanovskaia, Maria;

; Yu, Cyndia;

We present the RF Quantum Upconverter (RQU) and describe its application to quantum metrology of electromagnetic modes between dc and the very high frequency band (VHF) ( $≲ 300$ MHz). The RQU uses a Josephson interferometer made up of superconducting loops and Josephson junctions to implement a parametric interaction between a low-frequency electromagnetic mode (between dc and VHF) and a mode in the microwave C Band ( $\sim 5$ GHz), analogous to the radiation pressure interaction between electromagnetic and mechanical modes in cavity optomechanics. We analyze RQU performance with quantum amplifier theory and show that the RQU can operate as a quantum-limited op-amp in this frequency range. It can also use nonclassical measurement protocols equivalent to those used in cavity optomechanics, including back-action evading (BAE) measurements, sideband cooling, and two-mode squeezing. These protocols enable experiments using dc VHF electromagnetic modes as quantum sensors with sensitivity better than the standard quantum limit (SQL). We demonstrate signal upconversion from low frequencies to the microwave C band using an RQU and show a phase-sensitive gain (extinction ratio) of $46.9 dB$ , which is a necessary step towards the realization of full BAE. Published by the American Physical Society 2025

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Sponsoring Organization:: USDOE

OSTI ID:: 2531025

Journal Information:: Physical Review Research, Journal Name: Physical Review Research Journal Issue: 1 Vol. 7; ISSN PPRHAI; ISSN 2643-1564

Publisher:: American Physical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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