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Title: Combined speckle- and propagation-based single shot two-dimensional phase retrieval method

Journal Article · · Optics Express
DOI: https://doi.org/10.1364/OE.531269 · OSTI ID:2481022

Single-shot two-dimensional (2D) phase retrieval (PR) can recover the phase shift distribution within an object from a single 2D x-ray phase contrast image (XPCI). Two competing XPCI imaging modalities often used for single-shot 2D PR to recover material properties critical for predictive performance capabilities are: speckle-based (SP-XPCI) and propagation-based (PB-XPCI) XPCI imaging. However, PR from SP-XPCI and PB-XPCI images are, respectively, limited to reconstructing accurately slowly and rapidly varying features due to noise and differences in their contrast mechanisms. Herein, we consider a combined speckle- and propagation-based XPCI (SPB-XPCI) image by introducing a mask to generate a reference pattern and imaging in the near-to-holographic regime to induce intensity modulations in the image. We develop a single-shot 2D PR method for SPB-XPCI images of pure phase objects without imposing restrictions such as object support constraints. It is compared against PR methods inspired by those developed for SP-XPCI and PB-XPCI on simulated and experimental images of a thin glass shell before and during shockwave compression. Reconstructed phase maps show improvements in quantitative scores of root-mean-square error and structural similarity index measure using our proposed method.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); University of Rochester, NY (United States)
Sponsoring Organization:
National Science Foundation (NSF); USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Fusion Energy Sciences (FES)
Grant/Contract Number:
89233218CNA000001; AC02-76SF00515; NA0003856; NA0003914; NA0004134; SC0019329; SC0020229
OSTI ID:
2481022
Report Number(s):
LA-UR--24-22916; Manuscript ID:  531269
Journal Information:
Optics Express, Journal Name: Optics Express Journal Issue: 26 Vol. 32; ISSN OPEXFF; ISSN 1094-4087
Publisher:
Optical Society of AmericaCopyright Statement
Country of Publication:
United States
Language:
English

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