Correlations Between In-Line X-ray Diffraction Data and In-Field Critical Current of Long, 4-μm Thick Film REBCO Tapes Made by Advanced MOCVD

Goel, Chirag; Paidpilli, Mahesh; Chen, Siwei; Li, Yi; Oad, Mahandar; Zhu, Lingfeng; Majkic, Goran; Selvamanickam, Venkat

doi:10.1109/tasc.2024.3503535

Title: Correlations Between In-Line X-ray Diffraction Data and In-Field Critical Current of Long, 4-μm Thick Film REBCO Tapes Made by Advanced MOCVD

Journal Article · 19 November 2024 · IEEE Transactions on Applied Superconductivity

DOI: https://doi.org/10.1109/tasc.2024.3503535 · OSTI ID:2479857

^[1]; Paidpilli, Mahesh ^[1];

^[1];

^[1]; Oad, Mahandar ^[1]; Zhu, Lingfeng ^[1]; Majkic, Goran ^[1];

^[1]

Univ. of Houston, TX (United States)

REBa₂Cu₃O_7-δ (REBCO, RE = rare earth) tapes with high critical current can be very impactful in high magnetic field applications at low temperatures and power applications at high temperatures. A pilot-scale Advanced Metal Organic Chemical Vapor Deposition (MOCVD) method was used to fabricate 50-m-long, 4+μm-thick REBCO tape in a single pass. Critical currents 3.3x that of commercial HTS tapes were achieved at 20 K, 12 T in these 50-m-long tapes. An in-line 2D X-ray Diffraction (XRD) system has been used to assess the quality of the long tapes in real-time, during manufacturing. The key peaks of REBCO, REO, and BZO phases were identified and utilized for tape quality analysis. Furthermore, a 20-m tape made by Advanced MOCVD was tested over its entire length by reel-to-reel (R2R) scanning Hall-probe microscopy (SHPM) at 65 K, 0.25 T, 2 T, and 4 T. 4-mm-wide strands of Advanced MOCVD tapes showed mean critical currents at 65 K of 530 A, 200 A, and 104 A at 0.25 T, 2 T, and 4 T respectively. The combined use of in-line and offline characterization techniques provides a reliable approach for assessing long REBCO tapes during manufacturing, serving as an effective feedback source for quality control in scaled-up REBCO tape deposition processes. This advancement contributes to the production of longer and more uniform high-performance REBCO tapes for large-scale, high-field superconducting applications

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Research Organization:: Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States); Univ. of Houston, TX (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE); USDOE Office of Science (SC); USDOE Office of Science (SC), High Energy Physics (HEP)

Grant/Contract Number:: EE0007869; SC0016220

OSTI ID:: 2479857

Journal Information:: IEEE Transactions on Applied Superconductivity, Journal Name: IEEE Transactions on Applied Superconductivity Journal Issue: 5 Vol. 35; ISSN 1051-8223

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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Title: Correlations Between In-Line X-ray Diffraction Data and In-Field Critical Current of Long, 4-μm Thick Film REBCO Tapes Made by Advanced MOCVD

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