Trace xenon detection in ambient helium by double-pulse laser-induced breakdown spectroscopy

Garrett, L.; Burger, M.; Lee, Y.; Kim, H.; Sabharwall, P.; Choi, S.; Jovanovic, I.

doi:10.1039/D4JA00358F

Title: Trace xenon detection in ambient helium by double-pulse laser-induced breakdown spectroscopy

Journal Article · 01 January 2025 · Journal of Analytical Atomic Spectrometry

DOI: https://doi.org/10.1039/D4JA00358F · OSTI ID:2478577

^[1];

^[1]; Lee, Y. ^[2]; Kim, H. ^[3]; Sabharwall, P. ^[4];

^[3]; Jovanovic, I. ^[1]

Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI 48109, USA, Gérard Mourou Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, MI 48109, USA
Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea, Device Solutions, Samsung Electronics, Pyeongtaek 17786, Republic of Korea
Department of Nuclear Engineering, Seoul National University, Seoul 08826, Republic of Korea
Idaho National Laboratory, Idaho Falls, ID 83415, USA

We demonstrate double-pulse LIBS enhances the Xenon signal up to 14× at a concentration of 1 μmol mol ⁻¹ in an ambient helium environment.

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Sponsoring Organization:: USDOE

Grant/Contract Number:: NONE; AC07-05ID14517

OSTI ID:: 2478577

Journal Information:: Journal of Analytical Atomic Spectrometry, Journal Name: Journal of Analytical Atomic Spectrometry; ISSN JASPE2; ISSN 0267-9477

Publisher:: Royal Society of Chemistry (RSC)Copyright Statement

Country of Publication:: United Kingdom

Language:: English

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