Imaging and Segmenting Grains and Subgrains Using Backscattered Electron Techniques

Bennett, IV, Thomas J.; Taleff, Eric M.

doi:10.1093/mam/ozae092

Title: Imaging and Segmenting Grains and Subgrains Using Backscattered Electron Techniques

Journal Article · 27 September 2024 · Microscopy and Microanalysis

DOI: https://doi.org/10.1093/mam/ozae092 · OSTI ID:2477931

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University of Texas at Austin, TX (United States); Department of Mechanical Engineering, The University of Texas at Austin
University of Texas at Austin, TX (United States)

We present two new methods of processing data from backscattered electron signals in a scanning electron microscope to image grains and subgrains. The first combines data from multiple backscattered electron images acquired at different specimen geometries to (1) better reveal grain boundaries in recrystallized microstructures and (2) distinguish between recrystallized and unrecrystallized regions in partially recrystallized microstructures. The second utilizes spherical harmonic transform indexing of electron backscatter diffraction patterns to produce high angular resolution orientation data that enable the characterization of subgrains. Subgrains are produced during high-temperature plastic deformation and have boundary misorientation angles ranging from a few degrees down to a few hundredths of a degree. Here, we also present an algorithm to automatically segment grains from combined backscattered electron image data or grains and subgrains from high angular resolution electron backscatter diffraction data. Together, these new techniques enable rapid measurements of individual grains and subgrains from large populations.

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Research Organization:: Florida State University, Tallahassee, FL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Accelerator R&D and Production (ARDAP); National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: SC0009960; 89233218CNA000001; NA0003525

OSTI ID:: 2477931

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 5 Vol. 30; ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)Copyright Statement

Country of Publication:: United States

Language:: English

References (26)

The dislocation microstructure of aluminum Kassner, M. E.; McMahon, M. E. Metallurgical and Materials Transactions A, Vol. 18, Issue 5 https://doi.org/10.1007/BF02646925	journal	May 1987
Flow stress, subgrain size, and subgrain stability at elevated temperature Sherby, Oleg D.; Klundt, Rodney H.; Miller, Alan K. Metallurgical Transactions A, Vol. 8, Issue 6 https://doi.org/10.1007/BF02661565	journal	June 1977
Dynamic Grain Growth Driven by Subgrain Boundaries in an Interstitial-Free Steel During Deformation at 850 °C Bennett, Thomas J.; Taleff, Eric M. Metallurgical and Materials Transactions A, Vol. 55, Issue 2 https://doi.org/10.1007/s11661-023-07256-w	journal	December 2023
Graph-cut methods for grain boundary segmentation Wang, Song; Waggoner, Jarrell; Simmons, Jeff JOM, Vol. 63, Issue 7 https://doi.org/10.1007/s11837-011-0111-5	journal	July 2011
Mechanical behavior of crystalline solids at elevated temperature Sherby, Oleg D.; Burke, Peter M. Progress in Materials Science, Vol. 13 https://doi.org/10.1016/0079-6425(68)90024-8	journal	January 1968
Automatic grain boundary detection and grain size analysis using polarization micrographs or orientation images Heilbronner, Renée Journal of Structural Geology, Vol. 22, Issue 7 https://doi.org/10.1016/S0191-8141(00)00014-6	journal	July 2000
SEraMic: A semi-automatic method for the segmentation of grain boundaries Podor, R.; Le Goff, X.; Lautru, J. Journal of the European Ceramic Society, Vol. 41, Issue 10 https://doi.org/10.1016/j.jeurceramsoc.2021.03.062	journal	August 2021
Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps Germain, L.; Kratsch, D.; Salib, M. Materials Characterization, Vol. 98 https://doi.org/10.1016/j.matchar.2014.10.007	journal	December 2014
c-Axis orientation determination of α-titanium using Computational Polarized Light Microscopy Jin, Ke-Wei; De Graef, Marc Materials Characterization, Vol. 167 https://doi.org/10.1016/j.matchar.2020.110503	journal	September 2020
Microstructure segmentation using multi-angle polarized light microscopy McCabe, Rodney J.; Savage, Daniel J.; Bhattacharyya, Abhishek Materials Characterization, Vol. 192 https://doi.org/10.1016/j.matchar.2022.112197	journal	October 2022
Grain detection from 2d and 3d EBSD data—Specification of the MTEX algorithm Bachmann, Florian; Hielscher, Ralf; Schaeben, Helmut Ultramicroscopy, Vol. 111, Issue 12 https://doi.org/10.1016/j.ultramic.2011.08.002	journal	December 2011
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald Ultramicroscopy, Vol. 148 https://doi.org/10.1016/j.ultramic.2014.09.005	journal	January 2015
Electron imaging with an EBSD detector Wright, Stuart I.; Nowell, Matthew M.; de Kloe, René Ultramicroscopy, Vol. 148 https://doi.org/10.1016/j.ultramic.2014.10.002	journal	January 2015
A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns Lenthe, W. C.; Singh, S.; Graef, M. De Ultramicroscopy, Vol. 207 https://doi.org/10.1016/j.ultramic.2019.112841	journal	December 2019
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns Sparks, Gregory; Shade, Paul A.; Uchic, Michael D. Ultramicroscopy, Vol. 222 https://doi.org/10.1016/j.ultramic.2020.113187	journal	March 2021
Comparison of Channeling Contrast between Ion and Electron Images Giannuzzi, L. A.; Michael, J. R. Microscopy and Microanalysis, Vol. 19, Issue 2 https://doi.org/10.1017/S1431927612014286	journal	March 2013
EMsoft: open source software for electron diffraction/image simulations Singh, Saransh; Ram, Farangis; De Graef, Marc Microscopy and Microanalysis, Vol. 23, Issue S1 https://doi.org/10.1017/S143192761700174X	journal	July 2017
Backscattered Electron Imaging with an EBSD Detector Schwarzer, Robert A.; Hjelen, Jarle Microscopy Today, Vol. 23, Issue 1 https://doi.org/10.1017/S1551929514001333	journal	January 2015
Practical, Unified, Motion and Missing Data Treatment in Degraded Video Kokaram, Anil Journal of Mathematical Imaging and Vision, Vol. 20, Issue 1/2 https://doi.org/10.1023/B:JMIV.0000011325.36760.1e	journal	January 2004
Efficient Graph-Based Image Segmentation Felzenszwalb, Pedro F.; Huttenlocher, Daniel P. International Journal of Computer Vision, Vol. 59, Issue 2 https://doi.org/10.1023/B:VISI.0000022288.19776.77	journal	September 2004
Fiji: an open-source platform for biological-image analysis Schindelin, Johannes; Arganda-Carreras, Ignacio; Frise, Erwin Nature Methods, Vol. 9, Issue 7 https://doi.org/10.1038/nmeth.2019	journal	June 2012
Electron channeling patterns in the scanning electron microscope Joy, David C.; Newbury, Dale E.; Davidson, David L. Journal of Applied Physics, Vol. 53, Issue 8 https://doi.org/10.1063/1.331668	journal	August 1982
Statistical Comparison of Substructures in Pure Aluminum Before and After Creep Deformation, Based on EBSD Image Data Rieder, Philipp; Petrich, Lukas; Serrano-Munoz, Itziar Microscopy and Microanalysis, Vol. 29, Issue 6 https://doi.org/10.1093/micmic/ozad121	journal	November 2023
A Threshold Selection Method from Gray-Level Histograms Otsu, Nobuyuki IEEE Transactions on Systems, Man, and Cybernetics, Vol. 9, Issue 1 https://doi.org/10.1109/TSMC.1979.4310076	journal	January 1979
On the High-Temperature Creep Behaviour and Substructures in Alpha-Iron Single Crystals Karashima, S.; Iikubo, T.; Oikawa, H. Transactions of the Japan Institute of Metals, Vol. 13, Issue 3 https://doi.org/10.2320/matertrans1960.13.176	journal	January 1972
Texture Analysis with MTEX – Free and Open Source Software Toolbox Bachmann, F.; Hielscher, Ralf; Schaeben, Helmut Solid State Phenomena, Vol. 160 https://doi.org/10.4028/www.scientific.net/SSP.160.63	journal	February 2010

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36 MATERIALS SCIENCE
backscattered electron imaging
electron backscatter diffraction (EBSD)
grain size
high resolution electron backscatter diffraction (HR-EBSD)
scanning electron microscopy
segmentation
subgrain size

Title: Imaging and Segmenting Grains and Subgrains Using Backscattered Electron Techniques

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