Polarization-dependent photoemission electron microscopy for domain imaging of inorganic and molecular materials

Ghosh, Atreyie; Spellberg, Joseph L.; King, Sarah B.

doi:10.1063/5.0225765

Title: Polarization-dependent photoemission electron microscopy for domain imaging of inorganic and molecular materials

Journal Article · 16 September 2024 · Journal of Chemical Physics

DOI: https://doi.org/10.1063/5.0225765 · OSTI ID:2477587

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University of Chicago, IL (United States); University of Chicago
University of Chicago, IL (United States)

Polarization-dependent photoemission electron microscopy (PD-PEEM) exploits spatial variation in the optical selection rules of materials to image domain formation and material organization on the nanoscale. In this Perspective, we discuss the mechanism of PD-PEEM that results in the observed image contrast in experiments and provide examples of a wide range of material domain structures that PD-PEEM has been able to elucidate, including molecular and polymer domains, local electronic structure and defect symmetry, (anti)ferroelectricity, and ferromagnetism. As a result, we discuss challenges and new directions that are possible with this tool for probing domain structure in materials, including investigating the formation of transient ordered states, multiferroics, and the influence of molecular and polymer order and disorder on excited state dynamics and charge transport.

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Research Organization:: University of Chicago, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)

Grant/Contract Number:: SC0021950

OSTI ID:: 2477587

Journal Information:: Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 11 Vol. 161; ISSN 0021-9606

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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