Understanding and Controlling the Formation of Nonradiative Defects in Blue Organic Triplet Emitters

Journal Article · 13 November 2024 · Physical Review. X

DOI: https://doi.org/10.1103/PhysRevX.14.041044 · OSTI ID:2477447

Zhao, Haonan ; Qu, Boning; Forrest, Stephen R.

Phosphorescent organic light-emitting devices (PHOLEDs) suffer from destructive molecular processes due to triplet-polaron and triplet-triplet annihilation. These processes are energetically driven and hence are particularly active in decreasing the lifetime of blue PHOLEDs. It has recently been shown that increasing triplet radiative rates via the Purcell effect effectively extends the device operational lifetime by reducing the triplet radiative lifetime, thus decreasing their density and the probability of triplet-annihilation reactions. We provide an analytical framework using Marcus theory to explain the observed, approximately exponential relationship between exciton energy and device lifetime. From transient drift-diffusion dynamics, we show that the Purcell effect reduces the exciton density in the steady state and increases the photoluminescent yield, thereby reducing defect generation rates and extending the device lifetime. We control the radiative rate of excitons in microcavities, thereby connecting the exciton energy and decay rates with the observed device lifetime. The device lifetime is shown to follow a power-law dependence on the Purcell factor ( ${\mathrm{PF}}^m$ ) with $m=1.5$ to 2.5, dependent on the TTA-to-TPA ratio and photoluminescence quantum yield. From our analysis, a fivefold increase in PF has the potential to extend the blue PHOLED lifetime by up to 2 orders of magnitude, making the blue PHOLED lifetime comparable to that of state-of-the-art green PHOLEDs. Published by the American Physical Society 2024

• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE)
• Grant/Contract Number: EE0009688
• OSTI ID: 2477447
• Journal Information: Physical Review. X, Journal Name: Physical Review. X Journal Issue: 4 Vol. 14; ISSN PRXHAE; ISSN 2160-3308
• Publisher: American Physical SocietyCopyright Statement
• Country of Publication: United States
• Language: English