A brief review on strain engineering of ferroelectric KxNa1-xNbO3 epitaxial thin films: Insights from phase-field simulations

Wang, Bo; Zhou, Mengjun; Yang, Tiannan; Chen, Long-Qing

doi:10.1557/s43578-024-01460-z

Title: A brief review on strain engineering of ferroelectric K_xNa_1-xNbO₃ epitaxial thin films: Insights from phase-field simulations

Journal Article · 24 October 2024 · Journal of Materials Research

DOI: https://doi.org/10.1557/s43578-024-01460-z · OSTI ID:2476148

^[1]; Zhou, Mengjun ^[2]; Yang, Tiannan ^[3]; Chen, Long-Qing ^[4]

Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Wuhan Univ. of Technology (China)
Shanghai Jiao Tong Univ. (China)
Pennsylvania State Univ., University Park, PA (United States)

Strains play a pivotal role in determining the phase equilibrium, domain configuration, and functional properties of the low-dimensional ferroelectrics. There is growing interest in the strain engineering of ferroelectric K_xNa_1-xNbO₃ (KNN) epitaxial thin films, which exhibit excellent physical properties and promise as eco-friendly alternatives to lead-based ferroelectrics for microdevice applications. Further, advances have been made in understanding the phase equilibria and transitions, domains and domain walls, and their relations to the physical properties of KNN epitaxial thin films using a combination of experiments and theoretical modeling, particularly phase-field simulations. Here, we review recent progress in these aspects and showcase the phase-field method for establishing strain phase diagrams, elucidating the domain and domain wall structures at equilibrium, and predicting the structure–property relationships in ferroelectric KNN thin films. We also discuss challenges and opportunities to further advance our understanding of KNN thin films and potentially unlock new functionalities by leveraging phase-field simulations.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); National Science Foundation (NSF); National Science Foundation of China

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 2476148

Report Number(s):: LLNL--JRNL-868348; 1104082

Journal Information:: Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 21 Vol. 39; ISSN 0884-2914

Publisher:: Springer NatureCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
domains and domain walls
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material properties
phase-field model

Title: A brief review on strain engineering of ferroelectric KxNa1-xNbO3 epitaxial thin films: Insights from phase-field simulations

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Title: A brief review on strain engineering of ferroelectric K_xNa_1-xNbO₃ epitaxial thin films: Insights from phase-field simulations