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Title: Measurements of K-edge and L-edge extended x-ray absorption fine structure at the national ignition facility (invited)

Journal Article · · Review of Scientific Instruments
DOI: https://doi.org/10.1063/5.0219575 · OSTI ID:2475832
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  1. Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
  2. Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)
  3. General Atomics, San Diego, CA (United States)

High-energy-density laser facilities and advances in dynamic compression techniques have expanded access to material states in the Terapascal regime relevant to inertial confinement fusion, planetary science, and geophysics. However, experimentally determining the material temperature in these extreme conditions has remained a difficult challenge. Extended X-ray Absorption Fine Structure (EXAFS), referring to the modulations in x-ray absorption above an absorption edge from photoelectrons’ interactions with neighboring atoms, has proven to be a versatile and robust technique for probing material temperature and density for mid-to-high Z elements under dynamic compression. The current platform at the National Ignition Facility has developed six configurations for EXAFS measurements between 7 and 18 keV for different absorption edges (Fe K, Co K, Cu K, Ta L3, Pb L3, and Zr K) using a curved-crystal spectrometer and a bright, continuum foil x-ray source. Here, in this work, we describe the platform geometry, x-ray source performance, spectrometer resolution and throughput, design considerations, and data in ambient and dynamic-compression conditions.

Research Organization:
Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC02-09CH11466; AC52-07NA27344
OSTI ID:
2475832
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 95; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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