X-ray sources for in situ wavelength calibration of x-ray imaging crystal spectrometers

Shah, K.; Delgado-Aparicio, L.; Kraus, B. F.; Ono, M.; Gao, L.; Umbach, B.; Perkins, L.; Pablant, N.; Hill, K. W.; Bitter, M.; Teall, S.; Drake, R.; Schmidt, G.

doi:10.1063/5.0219583

Title: X-ray sources for in situ wavelength calibration of x-ray imaging crystal spectrometers

Journal Article · 30 September 2024 · Review of Scientific Instruments

DOI: https://doi.org/10.1063/5.0219583 · OSTI ID:2475827

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Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)
Princeton Plasma Physics Laboratory 1 , Princeton, New Jersey 08543,
Proto Manufacturing Inc., Taylor, MI (United States)

X-ray sources for a range of wavelengths are being considered for in situ calibration of X-ray Imaging Crystal Spectrometers (XICSs) and for monitoring line shifts due to changes in the crystal temperature, which can vary during experimental operation over a day [A. Ince-Cushman et al., Rev. Sci. Instrum. 79, 10E302 (2008), L. Delgado-Aparicio et al., Plasma Phys. Control. Fusion 55, 125011 (2013)]. Such crystal temperature dependent shifts, if not accounted for, could be erroneously interpreted as Doppler shifts leading to errors in plasma flow-velocity measurements. The x-ray sources encompass characteristic x-ray lines falling within the wavelength range of 0.9–4.0 Å, relevant for the XICSs on present and future fusion devices. Several technological challenges associated with the development of x-ray sources for in situ calibration are identified and are being addressed in the design of multiple x-ray tubes, which will be installed inside the spectrometer housing of the XICS for the JT-60SA tokamak. These x-ray sources will be especially useful for in situ calibration between plasma discharges. Here, in this paper, laboratory experiments are described that were conducted with a Cu x-ray source, a heated quartz (102) crystal, and a pixelated Pilatus detector to measure the temperature dependent shifts of the Cu Kα₁ and Kα₂ lines at 1.5405 and 1.5443 Å, respectively, and to evaluate the 2d-lattice constant for the Bragg reflecting crystal planes as a function of temperature, which, in the case of in situ wavelength calibration, would have to be used for numerical analysis of the x-ray spectra from the plasma.

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Research Organization:: Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-09CH11466

OSTI ID:: 2475827

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 95; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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