High-speed measurement of rotational anisotropy nonlinear optical harmonic generation using position-sensitive detection

Harter, J. W.; Niu, L.; Woss, A. J.; Hsieh, D.

doi:10.1364/ol.40.004671

Title: High-speed measurement of rotational anisotropy nonlinear optical harmonic generation using position-sensitive detection

Journal Article · 07 October 2015 · Optics Letters

DOI: https://doi.org/10.1364/ol.40.004671 · OSTI ID:2473679

Harter, J. W. ^[1]; Niu, L. ^[2]; Woss, A. J. ^[3]; Hsieh, D. ^[2]

California Institute of Technology (CalTech), Pasadena, CA (United States); California Institute of Technology
California Institute of Technology (CalTech), Pasadena, CA (United States)
University of Cambridge (United Kingdom)

We present a method of performing high-speed rotational anisotropy nonlinear optical harmonic generation experiments at rotational frequencies of several hertz by projecting the harmonic light reflected at different angles from a sample onto a stationary position-sensitive detector. The high rotational speed of the technique, 10³ to 10⁴ times larger than existing methods, permits precise measurements of the crystallographic and electronic symmetries of samples by averaging over low frequency laser-power, beam-pointing, and pulse-width fluctuations. As a result, we demonstrate the sensitivity of our technique by resolving the bulk fourfold rotational symmetry of GaAs about its [001] axis using second-harmonic generation.

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Research Organization:: California Institute of Technology (CalTech), Pasadena, CA (United States)

Sponsoring Organization:: Alfred P. Sloan Foundation (A.P. Sloan Foundation); Army Research Office (ARO); Gordon and Betty Moore Foundation; National Science Foundation (NSF); USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0010533

OSTI ID:: 2473679

Journal Information:: Optics Letters, Journal Name: Optics Letters Journal Issue: 20 Vol. 40; ISSN 0146-9592

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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