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Title: Uncertainties in Atomic Data for Modeling Astrophysical Charge Exchange Plasmas

Journal Article · · Sensors
DOI: https://doi.org/10.3390/s22030752 · OSTI ID:2471169
ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [3]
  1. SRON Netherlands Institute for Space Research, Leiden (Netherlands); RIKEN High Energy Astrophysics Laboratory, Saitama (Japan)
  2. NASA Goddard Space Flight Center, Greenbelt, MD (United States); Max-Planck-Institut fǜr Kernphysik, Heidelberg (Germany); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
  3. Chinese Academy of Sciences, Lanzhou (China); University of Chinese Academy of Sciences, Beijing (China)

Relevant uncertainties of theoretical atomic data are vital to determining the accuracy of plasma diagnostics in a number of areas, including, in particular, the astrophysical study. We present a new calculation of the uncertainties on the present theoretical ion-impact charge exchange atomic data and X-ray spectra, based on a set of comparisons with the existing laboratory data obtained in historical merged-beam, cold-target recoil-ion momentum spectroscopy, and electron beam ion traps experiments. The average systematic uncertainties are found to be 35–88% on the total cross sections, and 57–75% on the characteristic line ratios. The model deviation increases as the collision energy decreases. The errors on total cross sections further induce a significant uncertainty to the calculation of ionization balance for low-temperature collisional plasmas. Substantial improvements of the atomic database and dedicated laboratory measurements are needed to obtain the current models, ready for the X-ray spectra from the next X-ray spectroscopic mission.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE; European Union’s Horizon 2020 Programme
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
2471169
Journal Information:
Sensors, Journal Name: Sensors Journal Issue: 3 Vol. 22; ISSN 1424-8220
Publisher:
MDPI AGCopyright Statement
Country of Publication:
United States
Language:
English

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