The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy

Ercius, Peter; Johnson, Ian J.; Pelz, Philipp; Savitzky, Benjamin H.; Hughes, Lauren; Brown, Hamish G.; Zeltmann, Steven E.; Hsu, Shang-Lin; Pedroso, Cassio C. S.; Cohen, Bruce E.; Ramesh, Ramamoorthy; Paul, David; Joseph, John M.; Stezelberger, Thorsten; Czarnik, Cory; Lent, Matthew; Fong, Erin; Ciston, Jim; Scott, Mary C.; Ophus, Colin; Minor, Andrew M.; Denes, Peter

doi:10.1093/mam/ozae086

Title: The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy

Journal Article · 18 September 2024 · Microscopy and Microanalysis

DOI: https://doi.org/10.1093/mam/ozae086 · OSTI ID:2462736

^[1]; Johnson, Ian J. ^[2]; Pelz, Philipp ^[1]; Savitzky, Benjamin H. ^[1]; Hughes, Lauren ^[1]; Brown, Hamish G. ^[1]; Zeltmann, Steven E. ^[3]; Hsu, Shang-Lin ^[3]; Pedroso, Cassio C. S. ^[4]; Cohen, Bruce E. ^[2]; Ramesh, Ramamoorthy ^[5]; Paul, David ^[6]; Joseph, John M. ^[2]; Stezelberger, Thorsten ^[2]; Czarnik, Cory ^[7]; Lent, Matthew ^[7]; Fong, Erin ^[2]; Ciston, Jim ^[1]; Scott, Mary C. ^[8]; Ophus, Colin ^[1] more »

Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy and Molecular Foundry
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Univ. of California, Berkeley, CA (United States)
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Molecular Foundry
Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Energy Research Scientific Computing Center (NERSC)
Gatan, Inc., Pleasanton, CA (United States)
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy and Molecular Foundry; Univ. of California, Berkeley, CA (United States)

We describe the development, operation, and application of the 4D Camera—a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ~480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10–700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 2462736

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 5 Vol. 30; ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)Copyright Statement

Country of Publication:: United States

Language:: English

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47 OTHER INSTRUMENTATION
4D-STEM
active pixel sensor
direct electron detector
phase contrast STEM
scanning transmission electron microscopy

Title: The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy

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