Large-Angle Rocking Beam Electron Diffraction of Large Unit Cell Crystals Using Direct Electron Detector

Busch, Robert; Ni, Hsu-Chih; Shao, Yu-Tsun; Zuo, Jian-Min

doi:10.1093/mam/ozae088

Title: Large-Angle Rocking Beam Electron Diffraction of Large Unit Cell Crystals Using Direct Electron Detector

Journal Article · 02 October 2024 · Microscopy and Microanalysis

DOI: https://doi.org/10.1093/mam/ozae088 · OSTI ID:2452838

; Ni, Hsu-Chih;

;

Abstract We report a large-angle rocking beam electron diffraction (LARBED) technique for electron diffraction analysis. Diffraction patterns are recorded in a scanning transmission electron microscope (STEM) using a direct electron detector with large dynamical range and fast readout. We use a nanobeam for diffraction and perform the beam double rocking by synchronizing the detector with the STEM scan coils for the recording. Using this approach, large-angle convergent beam electron diffraction (LACBED) patterns of different reflections are obtained simultaneously. By using a nanobeam, instead of a focused beam, the LARBED technique can be applied to beam-sensitive crystals as well as crystals with large unit cells. This paper describes the implementation of LARBED and evaluates the performance using silicon and gadolinium gallium garnet crystals as test samples. We demonstrate that our method provides an effective and robust way for recording LARBED patterns and paves the way for quantitative electron diffraction of large unit cell and beam-sensitive crystals.

View Journal Article

Cite

Export

Save

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0024064

OSTI ID:: 2452838

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 1 Vol. 31; ISSN 1431-9276

Publisher:: Oxford University PressCopyright Statement

Country of Publication:: United States

Language:: English

References (38)

Fortran source listing for simulating three‐dimensional convergent beam patterns with absorption by the Bloch wave method Zuo, J. M.; Gjonnes, K.; Spence, J. C. H. Journal of Electron Microscopy Technique, Vol. 12, Issue 1 https://doi.org/10.1002/jemt.1060120105	journal	May 1989
Convergent beam diffraction studies of interfaces, defects, and multilayers Cherns, D.; Preston, A. R. Journal of Electron Microscopy Technique, Vol. 13, Issue 2 https://doi.org/10.1002/jemt.1060130204	journal	October 1989
Electron Microdiffraction Spence, J. C. H.; Zuo, J. M. Springer New York, NY https://doi.org/10.1007/978-1-4899-2353-0	book	January 1992
Energy-Filtering Transmission Electron Microscopy Reimer, Ludwig Springer Series in Optical Sciences https://doi.org/10.1007/978-3-540-48995-5	book	January 1995
Zone-axis patterns formed by a new double-rocking technique Eades, J. A. Ultramicroscopy, Vol. 5, Issue 1-3 https://doi.org/10.1016/0304-3991(80)90013-3	journal	January 1980
Effects of energy filtering in LACBED patterns Jordan, I. K.; Rossouw, C. J.; Vincent, R. Ultramicroscopy, Vol. 35, Issue 3-4 https://doi.org/10.1016/0304-3991(91)90075-H	journal	June 1991
Automated lattice parameter measurement from HOLZ lines and their use for the measurement of oxygen content in YBa2Cu3O7-δ from nanometer-sized region Zuo, J. M. Ultramicroscopy, Vol. 41, Issue 1-3 https://doi.org/10.1016/0304-3991(92)90110-6	journal	April 1992
Double conical beam-rocking system for measurement of integrated electron diffraction intensities Vincent, R.; Midgley, P. A. Ultramicroscopy, Vol. 53, Issue 3 https://doi.org/10.1016/0304-3991(94)90039-6	journal	March 1994
Strain characterization in SOI and strained-Si on SGOI MOSFET channel using nano-beam electron diffraction (NBD) Usuda, Koji; Numata, Toshinori; Irisawa, Toshifumi Materials Science and Engineering: B, Vol. 124-125 https://doi.org/10.1016/j.mseb.2005.08.062	journal	December 2005
Aberration-compensated large-angle rocking-beam electron diffraction Koch, Christoph T. Ultramicroscopy, Vol. 111, Issue 7 https://doi.org/10.1016/j.ultramic.2010.12.014	journal	June 2011
Evaluation of two-dimensional strain distribution by STEM/NBD Uesugi, Fumihiko; Hokazono, Akira; Takeno, Shiro Ultramicroscopy, Vol. 111, Issue 8 https://doi.org/10.1016/j.ultramic.2011.01.035	journal	July 2011
High-resolution scanning precession electron diffraction: Alignment and spatial resolution Barnard, Jonathan S.; Johnstone, Duncan N.; Midgley, Paul A. Ultramicroscopy, Vol. 174 https://doi.org/10.1016/j.ultramic.2016.12.018	journal	March 2017
Structure refinement from ‘digital’ large angle convergent beam electron diffraction patterns Hubert, A. J. M.; Römer, R.; Beanland, R. Ultramicroscopy, Vol. 198 https://doi.org/10.1016/j.ultramic.2018.12.007	journal	March 2019
Lattice strain mapping using circular Hough transform for electron diffraction disk detection Yuan, Renliang; Zhang, Jiong; Zuo, Jian-Min Ultramicroscopy, Vol. 207 https://doi.org/10.1016/j.ultramic.2019.112837	journal	December 2019
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets Yuan, Renliang; Zhang, Jiong; He, Lingfeng Ultramicroscopy https://doi.org/10.1016/j.ultramic.2021.113256	journal	March 2021
Solving the crystallographic phase problem using dynamical scattering in electron diffraction Koch, Christoph T. Ultramicroscopy, Vol. 247 https://doi.org/10.1016/j.ultramic.2023.113701	journal	May 2023
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol Microscopy and Microanalysis, Vol. 22, Issue 1 https://doi.org/10.1017/S1431927615015664	journal	January 2016
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Ophus, Colin Microscopy and Microanalysis, Vol. 25, Issue 3 https://doi.org/10.1017/S1431927619000497	journal	May 2019
Diffraction of Convergent Electron Beams Macgillavry, Carolina H. Nature, Vol. 145, Issue 3666 https://doi.org/10.1038/145189a0	journal	February 1940
Direct observation of d-orbital holes and Cu–Cu bonding in Cu2O Zuo, J. M.; Kim, M.; O'Keeffe, M. Nature, Vol. 401, Issue 6748 https://doi.org/10.1038/43403	journal	September 1999
Design and first applications of a post-column imaging filter Krivanek, Ondrej L.; Gubbens, Alexander J.; Dellby, Niklas Microscopy Microanalysis Microstructures, Vol. 3, Issue 2-3 https://doi.org/10.1051/mmm:0199200302-3018700	journal	January 1992
Electron precession: A guide for implementation Own, C. S.; Marks, L. D.; Sinkler, Wharton Review of Scientific Instruments, Vol. 76, Issue 3 https://doi.org/10.1063/1.1866612	journal	March 2005
Improved precision in strain measurement using nanobeam electron diffraction Béché, A.; Rouvière, J. L.; Clément, L. Applied Physics Letters, Vol. 95, Issue 12 https://doi.org/10.1063/1.3224886	journal	September 2009
Strain mapping at nanometer resolution using advanced nano-beam electron diffraction Ozdol, V. B.; Gammer, C.; Jin, X. G. Applied Physics Letters, Vol. 106, Issue 25 https://doi.org/10.1063/1.4922994	journal	June 2015
Data-driven electron microscopy: electron diffraction imaging of materials structural properties Zuo, Jian-Min; Yuan, Renliang; Shao, Yu-Tsun Microscopy, Vol. 71, Issue Supplement_1 https://doi.org/10.1093/jmicro/dfab032	journal	February 2022
Symmetry and defects in rhombohedral single-crystalline Na 0.5 Bi 0.5 TiO 3 Beanland, Richard; Thomas, Pam A. Physical Review B, Vol. 89, Issue 17 https://doi.org/10.1103/PhysRevB.89.174102	journal	May 2014
Direct Imaging of Nanoscale Phase Separation in La 0.55 Ca 0.45 MnO 3 : Relationship to Colossal Magnetoresistance Tao, J.; Niebieskikwiat, D.; Varela, M. Physical Review Letters, Vol. 103, Issue 9 https://doi.org/10.1103/PhysRevLett.103.097202	journal	August 2009
Charge density and chemical bonding in rutile, TiO ₂ Jiang, B.; Zuo, J. M.; Jiang, N. Acta Crystallographica Section A Foundations of Crystallography, Vol. 59, Issue 4 https://doi.org/10.1107/S010876730301122X	journal	June 2003
Digital electron diffraction – seeing the whole picture Beanland, Richard; Thomas, Paul J.; Woodward, David I. Acta Crystallographica Section A Foundations of Crystallography, Vol. 69, Issue 4 https://doi.org/10.1107/S0108767313010143	journal	May 2013
Point-group determination by convergent-beam electron diffraction Tanaka, M.; Saito, R.; Sekii, H. Acta Crystallographica Section A Foundations of Crystallography, Vol. 39, Issue 3 https://doi.org/10.1107/S010876738300080X	journal	May 1983
Space-group analyses of thin precipitates by different convergent-beam electron diffraction procedures Howe, J. M.; Sarikaya, M.; Gronsky, R. Acta Crystallographica Section A Foundations of Crystallography, Vol. 42, Issue 5 https://doi.org/10.1107/S0108767386099099	journal	September 1986
Absorptive form factors for high-energy electron diffraction Bird, D. M.; King, Q. A. Acta Crystallographica Section A Foundations of Crystallography, Vol. 46, Issue 3 https://doi.org/10.1107/S0108767389011906	journal	March 1990
A New Approach Towards Measuring Structure Factors and Valence-Electron Distribution in Crystals with Large Unit Cells Taftø, J.; Zhu, Y.; Wu, L. Acta Crystallographica Section A Foundations of Crystallography, Vol. 54, Issue 5 https://doi.org/10.1107/S0108767397018369	journal	September 1998
Refinement of crystal structural parameters using two-dimensional energy-filtered CBED patterns Tsuda, Kenji; Tanaka, Michiyoshi Acta Crystallographica Section A Foundations of Crystallography, Vol. 55, Issue 5 https://doi.org/10.1107/S0108767399005401	journal	September 1999
Observation of the breakdown of Friedel's law in electron diffraction and symmetry determination from zero-layer interactions Goodman, P.; Lehmpfuhl, G. Acta Crystallographica Section A, Vol. 24, Issue 3 https://doi.org/10.1107/S0567739468000677	journal	May 1968
Relativistic Hartree–Fock X-ray and electron scattering factors Doyle, P. A.; Turner, P. S. Acta Crystallographica Section A, Vol. 24, Issue 3 https://doi.org/10.1107/S0567739468000756	journal	May 1968
CBED and LACBED characterization of crystal defects Morniroli, J. P. Journal of Microscopy, Vol. 223, Issue 3 https://doi.org/10.1111/j.1365-2818.2006.01630.x	journal	September 2006
The Bonding Electron Density in Aluminum Nakashima, P. N. H.; Smith, A. E.; Etheridge, J. Science, Vol. 331, Issue 6024 https://doi.org/10.1126/science.1198543	journal	March 2011

Similar Records

Large-angle convergent-beam electron-diffraction study of coherent precipitates and decorated dislocations

Conference · 1996 · OSTI ID:468959

Wiezorek, J M.K.; Fraser, H L

Atomic structures determined from digitally defined nanocrystalline regions

Journal Article · 2020 · IUCrJ · OSTI ID:1616492

Gallagher-Jones, Marcus; Bustillo, Karen C.; Ophus, Colin; +5 more

Mapping valence electron distributions with multipole density formalism using 4D-STEM

Journal Article · 2020 · Ultramicroscopy · OSTI ID:1760644

Wu, Lijun; Meng, Qingping; Zhu, Yimei

Title: Large-Angle Rocking Beam Electron Diffraction of Large Unit Cell Crystals Using Direct Electron Detector

Citation Formats

References (38)

Similar Records

Related Subjects