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Title: ATLAS-MAP: An Automated Test Station for Gated Electronic Transport Measurements

Journal Article · · ACS Measurement Science Au
ORCiD logo [1];  [2]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]
  1. Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis 55455, Minnesota, United States, Department of Chemical Engineering and Materials Science, Center for Programmable Energy Catalysis, University of Minnesota, 421 Washington Ave. SE, Minneapolis 55455, Minnesota, United States
  2. Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis 55455, Minnesota, United States

Not Available

Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0023464; SC0021163
OSTI ID:
2448456
Journal Information:
ACS Measurement Science Au, Journal Name: ACS Measurement Science Au Journal Issue: 6 Vol. 4; ISSN 2694-250X
Publisher:
American Chemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

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PassStat, a simple but fast, precise and versatile open source potentiostat journal April 2022
Electron and Ambipolar Transport in Organic Field-Effect Transistors journal April 2007
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Field Effect Modulation of Outer-Sphere Electrochemistry at Back-Gated, Ultrathin ZnO Electrodes journal June 2016
Charge carrier mobility in thin films of organic semiconductors by the gated van der Pauw method journal April 2017
Critical assessment of charge mobility extraction in FETs journal December 2017
Metrology for the next generation of semiconductor devices journal October 2018
How to report and benchmark emerging field-effect transistors journal July 2022
Effects of sample thickness on the van der Pauw technique for resistivity measurements journal March 2005
Analysis of the contact resistance in staggered, top-gate organic field-effect transistors journal November 2007
Contact resistance and threshold voltage extraction in n-channel organic thin film transistors on plastic substrates journal April 2009
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Electrostatic derivation for the van der Pauw formula and simulation using arbitrarily shaped resistive materials journal July 2022
A low-cost computer-controlled Arduino-based educational laboratory system for teaching the fundamentals of photovoltaic cells journal September 2012
Effects of the channel thickness on the structural and electrical characteristics of room-temperature fabricated ZnO thin-film transistors journal May 2007
Electrical characterization of 2D materials-based field-effect transistors journal November 2020
Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends
  • Grochowski, A.; Bhattacharya, D.; Viswanathan, T. R.
  • IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, Vol. 44, Issue 8 https://doi.org/10.1109/82.618036
journal January 1997
A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry journal January 2020
ZnO Devices and Applications: A Review of Current Status and Future Prospects journal July 2010
Charge Distribution and Contact Resistance Model for Coplanar Organic Field-Effect Transistors journal January 2013
A method of measuring specific resistivity and Hall effect of discs of arbitrary shape book March 1991
A Short Review on Properties and Applications of Zinc Oxide Based Thin Films and Devices journal April 2020
Transfer‐curve assessment of oxide thin‐film transistors journal October 2010

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