Difficult Measurements of Materials Systems at Cryogenic Temperatures: Cryo-EELS and Cryo-4D-STEM

Journal Article · 24 July 2024 · Microscopy and Microanalysis

DOI: https://doi.org/10.1093/mam/ozae044.1071 · OSTI ID:2440378

Ercius, Peter ^[1]; Susarla, Sandhya ^[2]; Naik, Mit H. ^[3]; Xie, Yujun ^[4]; Wang, Jingyang ^[3]; Raja, Archana ^[1]; Ophus, Colin ^[1]; Zheng, Haimei ^[3]

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1. Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Molecular Foundry
2. Arizona State Univ., Tempe, AZ (United States)
3. Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
4. Shanghai Jiao Tong Univ. (China)

Scanning/transmission electron microscopy (S/TEM) in materials science has traditionally been accomplished at room temperature due to their solid state in this temperature range and relative insensitivity to radiolysis damage. Cooling to cryogenic temperatures tended to introduce instabilities such as vibration and drift and can lead to the buildup of carbon contamination or ice reducing contrast. The need to expand TEM experimental techniques into new fields such as quantum and battery materials led to new efforts to reduce these instabilities while achieving temperatures at or well below liquid nitrogen (77 K). Further, developments in detector and spectrometer technology brought new capabilities for high resolution electron energy loss spectroscopy (EELS) and scanning nanodiffraction (4D-STEM). These experimental modalities can require even tighter controls of drift, vibration, and exposure time. Here this presentation will discuss accomplishing difficult experiments at cryogenic temperatures in honor of the late Dr. Lena Kourkoutis who inspired and led many such experiments.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
• Grant/Contract Number: AC02-05CH11231
• OSTI ID: 2440378
• Journal Information: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: Supplement_1 Vol. 30; ISSN 1431-9276
• Publisher: Microscopy Society of America (MSA)Copyright Statement
• Country of Publication: United States
• Language: English