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Title: Sub-nanosecond time-resolved radiation measurement using x-ray focusing crystal spectrometers

Journal Article · · Review of Scientific Instruments
DOI: https://doi.org/10.1063/5.0150183 · OSTI ID:2439474

Here, in this paper, we describe a technique using a crystal spectrometer, a silicon-diode detector, and a filtered photoconductive detector to monitor photon energies in the L-shell (0.9–1 keV) and K-shell regimes for nickel and copper hybrid X-pinch x-ray sources. The detectors, system cabling, and an 8 GHz digital oscilloscope in combination enable time resolution better than 200 ps for photoconductive detectors and 700 ps for silicon-diode detectors of the K- and L-shell radiation signals, respectively. We substantially improve the relative timing of signals obtained using the oscilloscope by using an x-ray streak camera with a crystal spectrometer to monitor the L-shell line spectra and, separately, the K-shell line spectra relative to the continuum burst to better than 17 ps time resolution. This combination of instruments enabled and validated a new method by which plasma conditions in nickel and copper X-pinches can be assessed immediately before and after the ~30 ps continuum x-ray burst produced by 370 kA hybrid X-pinches. In general, the method described here can be applied to observe otherwise highly filter-absorbed radiation in the presence of a broad spectrum of higher energy radiation by combining x-ray crystals and detectors.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Fusion Energy Sciences (FES)
Grant/Contract Number:
89233218CNA000001; NA0004027; NA0003764; SC0018088
OSTI ID:
2439474
Report Number(s):
LA-UR--24-20727
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 8 Vol. 94; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (10)

Stable silicon photodiodes for absolute intensity measurements in the VUV and soft X-ray regions journal May 1996
Time-resolved spectroscopy of Al, Ti, and Mo X pinch radiation using an X-ray streak camera journal April 2003
Soft x‐ray detection with diamond photoconductive detectors journal October 1990
The x ‐pinch as a point source of x rays for backlighting journal January 1995
Point-projection x-ray radiography using an X pinch as the radiation source journal January 2001
Plasma points and radiative collapse in vacuum sparks journal May 1991
Contraction of Z pinches actuated by radiation losses journal January 1976
Direct comparison of wire, foil, and hybrid X-pinches on a 200 kA, 150 ns current driver journal February 2021
Hybrid X-pinches journal May 2012
X-pinch. Part I journal April 2015

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