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Title: Circular dichroism in hard X-ray photoelectron diffraction observed by time-of-flight momentum microscopy

Journal Article · · Ultramicroscopy
ORCiD logo [1]; ORCiD logo [2];  [3];  [3];  [4];  [3];  [3];  [5];  [6];  [6];  [6];  [6];  [6];  [6];  [6];  [6];  [7];  [8];  [9];  [8] more »;  [2];  [3];  [3] « less
  1. Johannes Gutenberg Univ., Mainz (Germany); Sumy State University (Ukraine)
  2. University of West Bohemia, Pilsen (Czech Republic)
  3. Johannes Gutenberg Univ., Mainz (Germany)
  4. Johannes Gutenberg Univ., Mainz (Germany); Institute of Magnetism of the NAS of Ukraine and MES of Ukraine, Kyiv (Ukraine)
  5. SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)
  6. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  7. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Hamburg (Germany)
  8. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Christian-Albrechts-Universität zu Kiel (Germany)
  9. Univ. of Science and Technology, Kraków (Poland)

X-ray photoelectron diffraction (XPD) is a powerful technique that yields detailed structural information of solids and thin films that complements electronic structure measurements. Among the strongholds of XPD we can identify dopant sites, track structural phase transitions, and perform holographic reconstruction. High-resolution imaging of kll-distributions (momentum microscopy) presents a new approach to core-level photoemission. It yields full-field kx-ky XPD patterns with unprecedented acquisition speed and richness in details. Here, we show that beyond the pure diffraction information, XPD patterns exhibit pronounced circular dichroism in the angular distribution (CDAD) with asymmetries up to 80%, alongside with rapid variations on a small kll-scale (0.1 Å-1). Measurements with circularly-polarized hard X-rays (hν = 6 keV) for a number of core levels, including Si, Ge, Mo and W, prove that core-level CDAD is a general phenomenon that is independent of atomic number. The fine structure in CDAD is more pronounced compared to the corresponding intensity patterns. Additionally, they obey the same symmetry rules as found for atomic and molecular species, and valence bands. Further, the CD is antisymmetric with respect to the mirror planes of the crystal, whose signatures are sharp zero lines. Calculations using both the Bloch-wave approach and one-step photoemission reveal the origin of the fine structure that represents the signature of Kikuchi diffraction. To disentangle the roles of photoexcitation and diffraction, XPD has been implemented into the Munich SPRKKR package to unify the one-step model of photoemission and multiple scattering theory.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-76SF00515
OSTI ID:
2423841
Journal Information:
Ultramicroscopy, Journal Name: Ultramicroscopy Journal Issue: C Vol. 250; ISSN 0304-3991
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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