Temperature-dependent optical constants of vanadium dioxide thin films deposited on polar dielectrics
- Texas Tech Univ., Lubbock, TX (United States)
- Texas Tech Univ., Lubbock, TX (United States); University of Texas Rio Grande Valley, Edinburg, TX (United States)
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Naval Research Lab. (NRL), Washington, DC (United States)
Coating polar dielectrics with thin film vanadium dioxide (VO2) enables one to exploit the temperature-dependent phase transition within VO2 to actively tune and modulate surface phonon polaritons at mid-infrared. However, controlling the behavior of such systems requires intimate knowledge of the temperature-dependent optical constants of VO2, which depend greatly on the growth conditions and substrate material. Here, in this work, we accurately determine the complex optical constants of VO2 on polar dielectrics across the insulator-to-metal phase transition (IMT) using only normal incident reflectance spectra by analyzing the reflectance with Kramers–Kronig relations and thin film Fresnel equations. This non-ellipsometry technique offers an advantage in determining the refractive index using a standard infrared spectrometer.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF); USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- 89233218CNA000001
- OSTI ID:
- 2406674
- Report Number(s):
- LA-UR--24-27187
- Journal Information:
- Optical Materials, Journal Name: Optical Materials Vol. 154; ISSN 0925-3467
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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