Theory for Cd 3 As 2 thin films in the presence of magnetic fields
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Ames Laboratory (AMES), Ames, IA (United States); Iowa State Univ., Ames, IA (United States); Univ. of Sao Paulo (Brazil)
- Univ. of Waterloo, ON (Canada); Perimeter Inst. for Theoretical Physics, Waterloo, ON (Canada)
- Ames Laboratory (AMES), Ames, IA (United States); Iowa State Univ., Ames, IA (United States); Saarland University Campus, Saarbrücken (Germany)
Here we present a theory for thin films of the Dirac semimetal Cd3As2 in the presence of magnetic fields. We show that, above a critical thickness, specific subbands n of thin film Cd3As2 are in a quantum spin Hall insulator regime and study their response to in- and out-of-plane magnetic fields. We find that sufficiently large in-plane Zeeman fields drive the system toward a 2D Dirac semimetal regime, provided the field is directed perpendicular to a high-symmetry mirror plane. For other directions, we find the Dirac points to be weakly gapped. We further investigate how the system responds to finite out-of-plane field components, both starting from the quantum spin Hall regime at small in-plane fields and from the 2D Dirac semimetal regimes at larger in-plane fields, addressing recent experimental observations in A. C. Lygo et al. [Phys. Rev. Lett. 130, 046201 (2023)] and B. Guo et al. [Phys. Rev. Lett. 131, 046601 (2023)].
- Research Organization:
- Ames Laboratory (AMES), Ames, IA (United States); Energy Frontier Research Centers (EFRC) (United States). Center for the Advancement of Topological Semimetals (CATS)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC02-07CH11358
- OSTI ID:
- 2386968
- Report Number(s):
- IS-J--11,375
- Journal Information:
- Physical Review. B, Journal Name: Physical Review. B Journal Issue: 15 Vol. 109; ISSN 2469-9950
- Publisher:
- American Physical Society (APS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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