In-house synthesized poly(ether ether ketone) ionenes. II. ToF-SIMS spectra in the negative ion mode

Journal Article · 11 February 2024 · Surface Science Spectra

DOI: https://doi.org/10.1116/6.0003133 · OSTI ID:2335872

Strange, Lyndi  ^[1]; Ravula, Sudhir  ^[2]; Zhu, Zihua  ^[1]; Bara, Jason E.  ^[2]; Chen, Ping  ^[1]; Heldebrant, David J.  ^[1]; Yao, Jennifer  ^[1]

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1. Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
2. University of Alabama, Tuscaloosa, AL (United States)

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to analyze poly(ether ether ketone) (PEEK) based membranes. PEEK membranes have been shown to be effective in the separation of CO₂ from flue gases (post-combustion technique). The PEEK membranes were synthesized using novel aromatic ether-ketone linkages inspired by PEEK with polymeric backbone bistriflimide [Tf2N]− counterions. One of the keys to advancing this technology is developing membranes that are selective and permeable toward CO₂, in which PEEK based membranes have been shown to be. Furthermore, the compatibility between various water lean solvents also needs to be investigated. Surface analytical techniques such as x-ray photoelectron spectroscopy and ToF-SIMS are useful for investigating chemical changes between membranes. Herein, we present ToF-SIMS data obtained in the negative ion mode for four different PEEK membranes designed for use in CO₂ capture systems. Positive ion mode spectra are reported in Paper I.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division (CSGB)
• Grant/Contract Number: AC05-76RL01830
• OSTI ID: 2335872
• Report Number(s): PNNL-SA--184767
• Journal Information: Surface Science Spectra, Journal Name: Surface Science Spectra Journal Issue: 1 Vol. 31; ISSN 1055-5269
• Publisher: American Vacuum Society - AIPCopyright Statement
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
PEEK-ionenes
time-of-flight secondary ion mass spectrometry
CO2 separation
surface spectra
thin films
analytical chemistry
ionic liquids
polymers
surface analysis techniques