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Title: Electronic and optical characterization of bulk single crystals of cubic boron nitride (cBN)

Journal Article · · AIP Advances
DOI: https://doi.org/10.1063/5.0092557 · OSTI ID:2319014
 [1];  [2]; ORCiD logo [3];  [2];  [4];  [5]; ORCiD logo [5]; ORCiD logo [2]; ORCiD logo [6]
  1. Morgan State University, Baltimore, MD (United States); University of the District of Columbia
  2. Morgan State University, Baltimore, MD (United States)
  3. Johns Hopkins Applied Physics Laboratory, Laurel, MD (United States)
  4. University of South Carolina, Columbia, SC (United States)
  5. George Mason University, Fairfax, VA (United States)
  6. Morgan State University, Baltimore, MD (United States); Cornell University, Ithaca, NY (United States)

Cubic boron nitride (cBN) is a relatively less studied wide bandgap semiconductor despite its many promising mechanical, thermal, and electronic properties. We report on the electronic, structural, and optical characterization of commercial cBN crystal platelets. Temperature dependent transport measurements revealed the charge limited diode behavior of the cBN crystals. The equilibrium Fermi level was determined to be 0.47 eV below the conduction band, and the electron conduction was identified as n-type. Unirradiated dark and amber colored cBN crystals displayed broad photoluminescence emission peaks centered around different wavelengths. RC series zero phonon line defect emission peaks were observed at room temperature from the electron beam irradiated and oxygen ion implanted cBN crystals, making this material a promising candidate for high power microwave devices, next generation power electronics, and future quantum sensing applications.

Research Organization:
University of the District of Columbia, Washington, DC (United States)
Sponsoring Organization:
Air Force Office of Scientific Research; National Science Foundation (NSF); USDOE; USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
NA0003945
OSTI ID:
2319014
Journal Information:
AIP Advances, Journal Name: AIP Advances Journal Issue: 9 Vol. 12; ISSN 2158-3226
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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