Title: Automated Defect Detection and Localization in Photovoltaic Cells Using Semantic Segmentation of Electroluminescence Images

Journal Article · · IEEE Journal of Photovoltaics

In this paper, we propose a deep learning based semantic segmentation model that identifies and segments defects in electroluminescence (EL) images of silicon photovoltaic (PV) cells. The proposed model can differentiate between cracks, contact interruptions, cell interconnect failures, and contact corrosion for both multicrystalline and monocrystalline silicon cells. Our model utilizes a segmentation Deeplabv3 model with a ResNet-50 backbone. It was trained on 17,064 EL images including 256 physically realistic simulated images of PV cells generated to deal with class imbalance. While performing semantic segmentation for five defect classes, this model achieves a weighted F1-score of 0.95, an unweighted F1-score of 0.69, a pixel-level global accuracy of 95.4%, and a mean intersection over union score of 57.3%. In addition, we introduce the UCF EL Defect dataset, a large-scale dataset consisting of 17,064 EL images, which will be publicly available for use by the PV and computer vision research communities.

Research Organization:
University of Central Florida, Orlando, FL (United States)
Sponsoring Organization:
National Science Foundation (NSF); USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
Grant/Contract Number:
EE0008155
OSTI ID:
2283912
Journal Information:
IEEE Journal of Photovoltaics, Journal Name: IEEE Journal of Photovoltaics Journal Issue: 1 Vol. 12; ISSN 2156-3381
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

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