Nano-compositional imaging of the lanthanum silicide system at THz wavelengths

Kim, R. H. J.; Pathak, A. K.; Park, J. -M.; Imran, M.; Haeuser, S. J.; Fei, Z.; Mudryk, Y.; Koschny, T.; Wang, J.

doi:10.1364/OE.507414

Title: Nano-compositional imaging of the lanthanum silicide system at THz wavelengths

Journal Article · 09 January 2024 · Optics Express

DOI: https://doi.org/10.1364/OE.507414 · OSTI ID:2280744

; Pathak, A. K.; Park, J. -M.; Imran, M.; Haeuser, S. J.; Fei, Z.; Mudryk, Y.; Koschny, T.;

Terahertz scattering-type scanning near-field optical microscopy (THz-sSNOM) provides a noninvasive way to probe the low frequency conductivity of materials and to characterize material compositions at the nanoscale. However, the potential capability of atomic compositional analysis with THz nanoscopy remains largely unexplored. Here, we perform THz near-field imaging and spectroscopy on a model rare-earth alloy of lanthanum silicide (La–Si) which is known to exhibit diverse compositional and structural phases. We identify subwavelength spatial variations in conductivity that is manifested as alloy microstructures down to much less than 1 μ m in size and is remarkably distinct from the surface topography of the material. Signal contrasts from the near-field scattering responses enable mapping the local silicon/lanthanum content differences. These observations demonstrate that THz-sSNOM offers a new avenue to investigate the compositional heterogeneity of material phases and their related nanoscale electrical as well as optical properties.

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Research Organization:: Ames Laboratory (AMES), Ames, IA (United States); General Electric, Schenectady; Iowa State U.; SUNY, Buffalo, Dept. Math.

Sponsoring Organization:: US Department of Energy; USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE Office of Science (SC), High Energy Physics (HEP)

Grant/Contract Number:: 89243024CSC000002; AC02-07CH11358; AC02-07CH11359

OSTI ID:: 2280744

Report Number(s):: FERMILAB-PUB-24-0905-SQMS-V; IS-J--11,240

Journal Information:: Optics Express, Journal Name: Optics Express Journal Issue: 2 Vol. 32; ISSN 1094-4087; ISSN OPEXFF

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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