Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Pinder, Joshua W.; Major, George H.; Baer, Donald R.; Terry, Jeff; Whitten, James E.; Čechal, Jan; Crossman, Jacob D.; Lizarbe, Alvaro J.; Jafari, Samira; Easton, Christopher D.; Baltrusaitis, Jonas; van Spronsen, Matthijs A.; Linford, Matthew R.

doi:10.1016/j.apsadv.2023.100534

Title: Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Journal Article · 31 January 2024 · Applied Surface Science Advances

DOI: https://doi.org/10.1016/j.apsadv.2023.100534 · OSTI ID:2279097

Pinder, Joshua W.; Major, George H.; Baer, Donald R.; Terry, Jeff; Whitten, James E.; Čechal, Jan; Crossman, Jacob D.; Lizarbe, Alvaro J.; Jafari, Samira; Easton, Christopher D.; Baltrusaitis, Jonas; van Spronsen, Matthijs A.;

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Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012577

OSTI ID:: 2279097

Journal Information:: Applied Surface Science Advances, Journal Name: Applied Surface Science Advances Journal Issue: C Vol. 19; ISSN 2666-5239

Publisher:: ElsevierCopyright Statement

Country of Publication:: Netherlands

Language:: English

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Application of XPS spectral subtraction and multivariate analysis for the characterization of Ar+ ion beam modified polyimide surfaces Pylypenko, Svitlana; Artyushkova, Kateryna; Fulghum, Julia E. Applied Surface Science, Vol. 256, Issue 10 https://doi.org/10.1016/j.apsusc.2009.12.006	journal	March 2010
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Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysis Morgan, David J. Surface and Interface Analysis, Vol. 55, Issue 11 https://doi.org/10.1002/sia.7254	journal	September 2023
Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer Lizarbe, Alvaro J.; Major, George H.; Fernandez, Vincent Surface and Interface Analysis, Vol. 55, Issue 9 https://doi.org/10.1002/sia.7238	journal	June 2023
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A practical guide to interpreting low energy ion scattering (LEIS) spectra Průša, Stanislav; Linford, Matthew R.; Vaníčková, Elena Applied Surface Science https://doi.org/10.1016/j.apsusc.2023.158793	journal	November 2023
Unveiling bonding states and roles of edges in nitrogen-doped graphene nanoribbon by X-ray photoelectron spectroscopy Yamada, Yasuhiro; Tanaka, Haruki; Kubo, Shingo Carbon, Vol. 185 https://doi.org/10.1016/j.carbon.2021.08.085	journal	November 2021
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XPS depth profiling study on the passive oxide film of carbon steel in saturated calcium hydroxide solution and the effect of chloride on the film properties Ghods, P.; Isgor, O. B.; Brown, J. R. Applied Surface Science, Vol. 257, Issue 10 https://doi.org/10.1016/j.apsusc.2010.12.120	journal	March 2011

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