Evaluation of a Large Area, 83 μm Pixel Pitch Amorphous Selenium Indirect Flat Panel Detector

Journal Article · 31 December 2023 · IEEE Transactions on Electron Devices

DOI: https://doi.org/10.1109/TED.2023.3338131 · OSTI ID:2278869

Hellier, Kaitlin  ^[1]; Mollov, Ivan  ^[2]; Swaby, Akyl ^[1]; Pryor, Paul ^[2]; Abbaszadeh, Shiva  ^[1]

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1. Electrical and Computer Engineering Department, University of California at Santa Cruz, Santa Cruz, CA, USA
2. Varex Imaging Corporation, Santa Clara, CA, USA

Not Available

• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP)
• Grant/Contract Number: SC0022343
• OSTI ID: 2278869
• Journal Information: IEEE Transactions on Electron Devices, Journal Name: IEEE Transactions on Electron Devices Journal Issue: 1 Vol. 71; ISSN 0018-9383
• Publisher: Institute of Electrical and Electronics EngineersCopyright Statement
• Country of Publication: United States
• Language: English