Advanced techniques in automated high-resolution scanning transmission electron microscopy

Pattison, Alexander J.; Pedroso, Cassio C. S.; Cohen, Bruce E.; Ondry, Justin C.; Alivisatos, A. Paul; Theis, Wolfgang; Ercius, Peter

doi:10.1088/1361-6528/acf938

Title: Advanced techniques in automated high-resolution scanning transmission electron microscopy

Journal Article · 20 October 2023 · Nanotechnology

DOI: https://doi.org/10.1088/1361-6528/acf938 · OSTI ID:2229280

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Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
University of California, Berkeley, CA (United States); Kavli Energy NanoScience Institute, Berkeley, CA (United States); University of Chicago, IL (United States)
University of California, Berkeley, CA (United States); Kavli Energy NanoScience Institute, Berkeley, CA (United States); University of Chicago, IL (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
University of Birmingham (United Kingdom)

Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using an all-piezo sample stage applied to large-scale imaging of nanoparticles and multimodal data acquisition. As a result, the system is available as part of the user program of the Molecular Foundry at Lawrence Berkeley National Laboratory.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 2229280

Journal Information:: Nanotechnology, Vol. 35, Issue 1; ISSN 0957-4484

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

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77 NANOSCIENCE AND NANOTECHNOLOGY
scanning transmission electron microscopy
automation
4D-STEM
Bayesian optimization

Title: Advanced techniques in automated high-resolution scanning transmission electron microscopy

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