Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities

Journal Article · 05 December 2023 · Surface and Interface Analysis

DOI: https://doi.org/10.1002/sia.7276 · OSTI ID:2228527

Fairley, Neal ^[1]; Bargiela, Pascal ^[2]; Baltrusaitis, Jonas  ^[3]

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1. Casa Software Ltd Teignmouth UK
2. The Institute for Research on Catalysis and the Environment of Lyon (IRCELYON) Villeurbanne France
3. Department of Chemical and Biomolecular Engineering Lehigh University Bethlehem Pennsylvania USA

Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contamination layer on Pt and presents, in brief, the approach whereby the component spectra are derived for ion beam cleaned Pt samples that can then utilize linear mathematics to peak fit said spectra thus quantifying the amount of each component including that assigned to the contamination itself of Pt metal.

• Sponsoring Organization: USDOE
• OSTI ID: 2228527
• Alternate ID(s): OSTI ID: 2228529
• Journal Information: Surface and Interface Analysis, Journal Name: Surface and Interface Analysis Vol. 56 Journal Issue: 2; ISSN 0142-2421
• Publisher: Wiley Blackwell (John Wiley & Sons)Copyright Statement
• Country of Publication: United Kingdom
• Language: English