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Title: Texture measurements on quartz single crystals to validate coordinate systems for neutron time-of-flight texture analysis

Journal Article · · Journal of Applied Crystallography (Online)
 [1]; ORCiD logo [2];  [2]; ORCiD logo [3];  [4]; ORCiD logo [2]
  1. New Mexico Institute of Mining and Technology, Socorro, NM (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
  2. Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
  3. Univ. of California, Berkeley, CA (United States)
  4. Univ. of Trento (Italy)

In crystallographic texture analysis, ensuring that sample directions are preserved from experiment to the resulting orientation distribution is crucial to obtain physical meaning from diffraction data. This work details a procedure to ensure instrument and sample coordinates are consistent when analyzing diffraction data with a Rietveld refinement using the texture analysis software MAUD. A quartz crystal is measured on the HIPPO diffractometer at Los Alamos National Laboratory for this purpose. The methods described here can be applied to any diffraction instrument measuring orientation distributions in polycrystalline materials.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
Grant/Contract Number:
89233218CNA000001; FG02-05ER15637; EAR 1343908; 2054951; 2154351; FG02-05ER15637)
OSTI ID:
2217680
Alternate ID(s):
OSTI ID: 2367495
Report Number(s):
LA-UR-23-21979
Journal Information:
Journal of Applied Crystallography (Online), Vol. 56, Issue 6; ISSN 1600-5767
Publisher:
International Union of CrystallographyCopyright Statement
Country of Publication:
United States
Language:
English

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