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Title: Study of perovskite CsPbBr3 detector polarization and its mitigation with ultrahigh x-ray flux

Journal Article · · Journal of Applied Physics
DOI: https://doi.org/10.1063/5.0151902 · OSTI ID:1996574

High-flux capable semiconductor x-ray detectors are essential in various applications, but the detrimental effects of detector polarization limit their use in many cases. Here, for this work, we studied the polarization of perovskite CsPbBr3 semiconductor detectors using ultrahigh flux synchrotron x rays (106–1012 photons s–1 mm–2 at 58.61 keV). The CsPbBr3 detectors did not show immediate polarization prominently until a flux higher than 1010 photons s–1 mm–2. Using the pump-and-probe technique, we visualized the spatial and temporal effects of polarization. The polarized region, represented by reduced photocurrent, extended beyond the area under direct irradiation, and the reduced photocurrent persisted after potential de-polarization treatments. We found that stronger applied electric fields and fewer carrier traps can mitigate polarization, represented by less photocurrent deficit. By examining the detectors’ current response under controlled ambient light, low, and high-flux x rays, we studied the trap filling and release behavior of CsPbBr3. We discovered that the polarization is caused by partial detector damage due to deep defects generated by ultrahigh flux x-ray irradiation. Our work provides insight into CsPbBr3 polarization under extremely intense x-ray radiation and shows that reducing crystal defects and increasing detector bias voltage are effective solutions.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Defense Advanced Research Projects Agency (DARPA); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
Grant/Contract Number:
AC02-76SF00515; AC02-06CH11357; HDTRA1-20-2-0002
OSTI ID:
1996574
Alternate ID(s):
OSTI ID: 2340749
Journal Information:
Journal of Applied Physics, Vol. 133, Issue 19; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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Figures / Tables (6)